Sjoerd Verhoeckx
Junior Scientist at cosine measurement systems
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 21 August 2024 Presentation + Paper
Proceedings Volume 13093, 1309319 (2024) https://doi.org/10.1117/12.3019675
KEYWORDS: Mirrors, X-rays, X-ray optics, Silicon, Semiconducting wafers, Optical benches, Spatial resolution, Optics manufacturing, X-ray telescopes, Robots

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 126790W (2023) https://doi.org/10.1117/12.2677330
KEYWORDS: Parabolic mirrors, Crystals, X-rays, Design and modelling, Beam divergence, Tolerancing, Collimation, Vacuum chambers, Beam expanders, Vibration

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 1267903 (2023) https://doi.org/10.1117/12.2678106
KEYWORDS: Mirrors, Silicon, X-ray optics, Semiconducting wafers, Wafer-level optics, X-rays, Synchrotron radiation, Ion beam finishing, Mirror surfaces, Laser cutting

Proceedings Article | 12 July 2023 Open Access Paper
Proceedings Volume 12777, 127770R (2023) https://doi.org/10.1117/12.2689003
KEYWORDS: Mirrors, Silicon, X-rays, Semiconducting wafers, Optics manufacturing, X-ray optics, Robots, Astronomical imaging, Wafer-level optics, Space mirrors

Proceedings Article | 31 August 2022 Presentation + Paper
Proceedings Volume 12181, 121810U (2022) https://doi.org/10.1117/12.2630775
KEYWORDS: Mirrors, Semiconducting wafers, Silicon, X-rays, Robots, X-ray optics, Wafer-level optics, Synchrotron radiation, Optical fabrication, Optical coatings

Proceedings Article | 17 September 2021 Presentation + Paper
Proceedings Volume 11822, 1182208 (2021) https://doi.org/10.1117/12.2594171
KEYWORDS: Mirrors, Tolerancing, Confocal microscopy, Mirror structures, Ear, X-ray optics, Epoxies, Silicon, Point spread functions, Optical alignment

Proceedings Article | 3 September 2021 Presentation + Paper
Proceedings Volume 11822, 1182207 (2021) https://doi.org/10.1117/12.2594234
KEYWORDS: Coating, Mirrors, Silicon, Semiconducting wafers, Photoresist materials, Optics manufacturing, Reflectivity, Inspection, Photography, Packaging

Proceedings Article | 31 August 2021 Presentation + Paper
Proceedings Volume 11822, 1182206 (2021) https://doi.org/10.1117/12.2593505
KEYWORDS: Mirrors, X-ray optics, X-rays, Robots, X-ray telescopes, Silicon, Semiconducting wafers, Wafer-level optics, Coating

Proceedings Article | 23 August 2021 Presentation + Paper
Proceedings Volume 11822, 1182209 (2021) https://doi.org/10.1117/12.2594230
KEYWORDS: Mirrors, X-ray optics, X-rays, Space operations, Silicon, Remote sensing, Mirror structures, X-ray telescopes, X-ray characterization, Optical testing

Proceedings Article | 11 June 2021 Open Access Presentation + Paper
Proceedings Volume 11852, 118521Z (2021) https://doi.org/10.1117/12.2599339

Proceedings Article | 15 December 2020 Poster + Paper
Proceedings Volume 11444, 114444G (2020) https://doi.org/10.1117/12.2561236
KEYWORDS: X-rays, Silicon, X-ray optics, X-ray characterization, CCD cameras, Synchrotron radiation, Imaging systems, Mirrors, Charge-coupled devices, Cameras

Proceedings Article | 30 October 2019 Presentation + Paper
Proceedings Volume 11119, 111190E (2019) https://doi.org/10.1117/12.2530941
KEYWORDS: Mirrors, Silicon, Manufacturing, X-ray optics, Optics manufacturing, X-rays, Semiconducting wafers, Reflectivity, Metals

Proceedings Article | 8 October 2019 Presentation + Paper
Proceedings Volume 11119, 111190K (2019) https://doi.org/10.1117/12.2530866
KEYWORDS: Silicon, X-ray optics, Mirrors, Space operations, X-ray telescopes, High energy astrophysics, X-rays, Observatories, Spatial resolution, Mirror stabilization

Proceedings Article | 12 September 2019 Paper
Proceedings Volume 11119, 111190L (2019) https://doi.org/10.1117/12.2530696
KEYWORDS: Silicon, Wafer-level optics, X-ray optics, Semiconducting wafers, Lightweight mirrors, Mirrors, X-ray telescopes, Spatial resolution, Gamma radiation, Biomedical optics

Proceedings Article | 10 September 2019 Paper
Proceedings Volume 11119, 111190J (2019) https://doi.org/10.1117/12.2530706
KEYWORDS: Mirrors, Confocal microscopy, Silicon, X-ray technology, X-ray optics, X-rays, Mirror structures, Observatories, Synchrotron radiation

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11119, 111190I (2019) https://doi.org/10.1117/12.2530977
KEYWORDS: X-ray optics, X-rays, Silicon, Optics manufacturing, X-ray technology, Mirrors, Metrology, Observatories, X-ray characterization, Synchrotron radiation

Proceedings Article | 12 July 2019 Open Access Paper
Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoex, Ljubiša Babić, Roy van der Hoeven, Kim van Straeten, Abdel Chatbi, David Girou, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Jan Willem den Herder, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Desiree Della Monica Ferreira, Finn Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik, Dervis Vernani
Proceedings Volume 11180, 1118023 (2019) https://doi.org/10.1117/12.2535994
KEYWORDS: Mirrors, Silicon, X-rays, Coating, Reflectivity, X-ray optics, Semiconducting wafers, Spatial resolution, Robots, Coating equipment

Showing 5 of 17 publications
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