Mr. Ethan Dunnell Profile

Ethan Dunnell

at Teledyne e2v UK Ltd.

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 5 October 2023 Presentation + Paper

NewATHENA optics technology

Marcos Bavdaz, Eric Wille, Mark Ayre, Ivo Ferreira, Brian Shortt, Sebastiaan Fransen, Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, David Girou, Mark Olde Riekering, Jeroen Haneveld, Ronald Start, Bart Schurink, Coen van Baren, Desiree Della Monica Ferreira, Sonny Massahi, Sara Svendsen, Finn Christensen, Michael Krumrey, Dieter Skroblin, Vadim Burwitz, Giovanni Pareschi, Bianca Salmaso, Alberto Moretti, Daniele Spiga, Stefano Basso, Giuseppe Valsecchi, Dervis Vernani, Paul Lupton, William Mundon, Ethan Dunnell, Mirko Riede, Tapio Korhonen, Mikko Pasanen, Alejandro Sanchez, Dominique Heinis, Carles Colldelram, Massimiliano Tordi, Norman Niewrzella, Richard Willingale

Proceedings Volume 12679, 1267902 (2023) https://doi.org/10.1117/12.2678522

KEYWORDS: Mirrors, X-ray optics, Spatial resolution, X-rays, Optical coatings, X-ray telescopes, Silicon, X-ray technology, Telescopes, Compliance

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Proceedings Article | 5 October 2023 Presentation + Paper

High-resolution and light-weight silicon pore x-ray optics

Boris Landgraf, Luis Abalo, Nicolas Barrière, Alex Bayerle, Donny de Borst, Luigi Castiglione, Maximilien Collon, Loes Crama, Abdelhakim Chatbi, Noë Eenkhoorn, David Girou, Ramses Günther, Enrico Hauser, Roy van der Hoeven, Jasper den Hollander, Yvette Jenkins, Adam Lassise, Laurens Keek, Christian Körnig, Sebastian Obwaller, Ben Okma, Paulo da Silva Ribeiro, Chris Rizos, Aniket Thete, Giuseppe Vacanti, Sjoerd Verhoeckx, Mark Vervest, Roel Visser, Luc Voruz, Marcos Bavdaz, Eric Wille, Ivo Ferreira, Mathijs Bosman, Jeroen Haneveld, Arenda Koelewijn, Jan-Joost Lankwarden, Mark Olde Riekerink, Bart Schurink, Ronald Start, Maurice Wijnperle, Coen van Baren, Levent Cibik, Michael Krumrey, Dieter Skroblin, Vadim Burwitz, Finn Christensen, Desirée Della Monica Ferreira, Sonny Massahi, Diego Sanz, Sara Svendsen, Ethan Dunnell, Paul Lupton, William Mundon, Andrew Rees, Dan Watley

Proceedings Volume 12679, 1267903 (2023) https://doi.org/10.1117/12.2678106

KEYWORDS: Mirrors, Silicon, X-ray optics, Semiconducting wafers, Wafer-level optics, X-rays, Synchrotron radiation, Ion beam finishing, Mirror surfaces, Laser cutting

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