Mr. Alexander B.C. Eigenraam Profile

Alexander B.C. Eigenraam

Senior Mechanical Design Engineer at SRON Netherlands Institute for Space Research

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Author

Publications (13)

Proceedings Article | 20 November 2024 Presentation + Paper

Calibration campaign of SPEXone Second Generation: early results and instrument performance

Matej Arko, Jochen Campo, Marijn Siemons, Robbert Winkelman, Alexander Eigenraam, Paul Tol, Mario Vretenar, Jeroen Rietjens, Martijn Smit, Jos Dingjan, Raj Nalla, Jeroen Peters, Berit Ahlers, Jens Löhring, Ralf Kohlhaas, Bastiaan van Diedenhoven, Ruud Hoogeveen, Aaldert van Amerongen

Proceedings Volume 13192, 131920Q (2024) https://doi.org/10.1117/12.3031658

KEYWORDS: Calibration, Equipment, Polarization, Spectroscopy, Sensors, Polarimetry, Spectral resolution, Modulation, Tolerancing

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Proceedings Article | 23 August 2024 Presentation + Paper

Prototyping liquid-crystal coronagraphs for exo-Earth imaging

Iva Laginja, David Doelman, Frans Snik, Pierre Baudoz, Felix Bettonvil, Jeroen H. Rietjens, Chris van Dijk, Kristien Peeters, Alexander Eigenraam, Erin Pougheon, Thomas van der Wielen, Marco Esposito, Thomas Wijnen, Mariya Krasteva, Matteo Taccola

Proceedings Volume 13092, 1309227 (2024) https://doi.org/10.1117/12.3016774

KEYWORDS: Coronagraphy, Polarization, Polarization gratings, Liquid crystals, Manufacturing, Diffraction gratings, Polarized light, Exoplanets

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Proceedings Article | 19 October 2023 Presentation + Paper

Detector characterization and upcoming instrument calibration of an improved version of the five-angle spectro-polarimeter SPEXone

Jochen Campo, Marijn Siemons, Matej Arko, Paul Tol, Jeroen Rietjens, Laura van der Schaaf, Martijn Smit, Mario Vretenar, Alexander Eigenraam, Joris van der Vlugt, Jelle Talsma, Simon Rosman, Robbert Winkelman, Jos Dingjan, Jeroen Peters, Jens Loehring, Ralf Kohlhaas, Aaldert van Amerongen, Bastiaan van Diedenhoven, Ruud Hoogeveen

Proceedings Volume 12729, 127290W (2023) https://doi.org/10.1117/12.2684431

KEYWORDS: Light sources and illumination, Calibration, Aerosols, Spectroscopy, Signal detection, Modulation, Stray light

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Proceedings Article | 12 July 2023 Open Access

SPEXone, the multi-angle spectropolarimeter for PACE, adjusted and improved for new space applications

Ruud Hoogeveen, Ralf Kohlhaas, Jochen Campo, Jeroen Rietjens, Alexander Eigenraam, Ian Veenendaal, Marijn Siemons, Joris van der Vlugt, Jelle Talsma, Jos Dingjan, Guus Borst, Raj Nalla, Jeroen Peters, Aaldert van Amerongen, Jochen Landgraf

Proceedings Volume 12777, 127774G (2023) https://doi.org/10.1117/12.2690835

KEYWORDS: Equipment, Telescopes, Aerosols, Polarization, Mirrors, Stray light, Reflection, Tunable filters, Spectroscopy, Linear filtering

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Proceedings Article | 11 June 2021 Open Access

Characterization and video chain development of the CMOS detector applied in the multi-angle spectro-polarimeter SPEXone

Jochen Campo, Paul Tol, Joris van der Vlugt, Martijn Smit, Jelle Talsma, Jens Johansen, Alexander Eigenraam, Richard van Hees, Otto Hasekamp, Marc Oort, Aaldert van Amerongen, Jeroen Rietjens

Proceedings Volume 11852, 1185213 (2021) https://doi.org/10.1117/12.2599224

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Proceedings Article | 8 October 2019 Presentation + Paper

Environmental testing of silicon pore optics for Athena

David Girou, Boris Landgraf, Alex Bayerle, Maximilien Collon, Ljubiša Babić, Nicolas Barrière, Ramses Günther, Enrico Hauser, Laurens Keek, Ben Okma, Giuseppe Vacanti, Sjoerd Verhoeckx, Mark Vervest, Luc Voruz, Marco Beijersbergen, Eric Wille, Marcos Bavdaz, Sebastiaan Fransen, Coen van Baren, Alexander Eigenraam, Nikhil More

Proceedings Volume 11119, 111190K (2019) https://doi.org/10.1117/12.2530866

KEYWORDS: Silicon, X-ray optics, Mirrors, Space operations, X-ray telescopes, High energy astrophysics, X-rays, Observatories, Spatial resolution, Mirror stabilization

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Proceedings Article | 10 September 2019 Paper

Assembly of confocal silicon pore optic mirror modules for Athena

Nicolas Barrière, Giuseppe Vacanti, Sjoerd Verhoeckx, Enrico Hauser, Mark Vervest, Laurens Keek, Ben Okma, Boris Landgraf, Ramses Günther, Luc Voruz, David Girou, Ljubiša Babić, Maximilien Collon, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Jeroen Haneveld, Arenda Koelewijn, Ronald Start, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Peter Müller, Evelyn Handick, Michael Krumrey, Giuseppe Valsecchi

Proceedings Volume 11119, 111190J (2019) https://doi.org/10.1117/12.2530706

KEYWORDS: Mirrors, Confocal microscopy, Silicon, X-ray technology, X-ray optics, X-rays, Mirror structures, Observatories, Synchrotron radiation

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Proceedings Article | 12 July 2019 Open Access

Silicon pore optics mirror module production and testing

Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoex, Ljubiša Babić, Roy van der Hoeven, Kim van Straeten, Abdel Chatbi, David Girou, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Jan Willem den Herder, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Desiree Della Monica Ferreira, Finn Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik, Dervis Vernani

Proceedings Volume 11180, 1118023 (2019) https://doi.org/10.1117/12.2535994

KEYWORDS: Mirrors, Silicon, X-rays, Coating, Reflectivity, X-ray optics, Semiconducting wafers, Spatial resolution, Robots, Coating equipment

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Proceedings Article | 18 July 2018 Presentation + Paper

Silicon pore optics mirror module production and testing

Maximilien Collon, Giuseppe Vacanti, Nicolas Barriere, Boris Landgraf, Ramses Guenther, Mark Vervest, Roy van der Hoeven, Abdel Chatbi, David Girou, Jessica Sforzini, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Jeroen Haneveld, Karin Booysen, Arenda Koelewijn, Maurice Wijnperlé, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Daniele Spiga, Giovanni Pareschi, Sonny Massahi, Finn Christensen, Desiree Della Monica Ferreira, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik

Proceedings Volume 10699, 106990Y (2018) https://doi.org/10.1117/12.2314479

KEYWORDS: Silicon, Mirrors, X-ray optics, X-rays, Observatories, Spatial resolution

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Proceedings Article | 13 October 2017 Presentation + Paper

Environmental testing of the ATHENA mirror modules

Boris Landgraf, David Girou, Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Ramses Günther, Mark Vervest, Roy van der Hoeven, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Coen van Baren, Alexander Eigenraam

Proceedings Volume 10399, 103990G (2017) https://doi.org/10.1117/12.2274298

KEYWORDS: Mirrors, Silicon, Annealing, X-ray optics, Failure analysis, Space telescopes, X-rays, Space mirrors, Multilayers, Climatology

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Proceedings Article | 29 August 2017 Presentation + Paper

Development of ATHENA mirror modules

Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Roy van der Hoeven, Danielle Dekker, Abdel Chatbi, David Girou, Jessica Sforzini, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Finn Christensen, Desirée Della Monica Ferreira, Giuseppe Valsecchi, Paul Oliver, Ian Checquer, Kevin Ball, Karl-Heinz Zuknik

Proceedings Volume 10399, 103990C (2017) https://doi.org/10.1117/12.2273704

KEYWORDS: Mirrors, X-ray optics, Silicon, Optics manufacturing, Wafer-level optics, X-ray astronomy, Semiconducting wafers, Astronomical imaging, X-ray telescopes, Spatial resolution

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Proceedings Article | 17 August 2016 Paper

Silicon pore optics for the ATHENA telescope

Maximilien Collon, Giuseppe Vacanti, Ramses Günther, Alex Yanson, Nicolas Barriere, Boris Landgraf, Mark Vervest, Abdelhakim Chatbi, Roy van der Hoeven, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Brian Shortt, Jeroen Haneveld, Arenda Koelewijn, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Paolo Conconi, Sonny Massahi, Finn Christensen, Giuseppe Valsecchi

Proceedings Volume 9905, 990528 (2016) https://doi.org/10.1117/12.2234427

KEYWORDS: X-ray optics, Silicon, X-ray telescopes, Semiconducting wafers, Mirrors, X-rays, Robots, Coating, Space telescopes, Spatial resolution

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Proceedings Article | 19 March 2015 Paper

Demonstration of parallel scanning probe microscope for high throughput metrology and inspection

Hamed Sadeghian, Bert Dekker, Rodolf Herfst, Jasper Winters, Alexander Eigenraam, Ramon Rijnbeek, Nicole Nulkes

Proceedings Volume 9424, 94240O (2015) https://doi.org/10.1117/12.2085495

KEYWORDS: Semiconducting wafers, Scanning probe microscopy, Metrology, Inspection, Atomic force microscopy, Scanning probe microscopes, Actuators, Computer aided design, 3D metrology, Photomasks

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Showing 5 of 13 publications

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