Dr. Johann Foucher
CEO
SPIE Involvement:
Author
Area of Expertise:
nanometrology , nanotechnologies , semiconductor industry , plasma physics , start-up , business development
Websites:
Publications (52)

Proceedings Article | 18 September 2024 Paper
Proceedings Volume 13273, 132731J (2024) https://doi.org/10.1117/12.3030895
KEYWORDS: Metrology, Artificial intelligence, Optical lithography, Design, Semiconducting wafers, Scanning electron microscopy, Data modeling, Inspection, Process control

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12954, 1295412 (2024) https://doi.org/10.1117/12.3010460
KEYWORDS: Data modeling, Education and training, Performance modeling, Modeling, Mathematical optimization, Quantum experiments, Data processing, Process engineering, Process modeling, Quantum processes

Proceedings Article | 10 April 2024 Poster + Paper
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Stéphanie Bricq, Yannick Benezeth, Franck Marzani, Sergio Martinez, Johann Foucher
Proceedings Volume 12955, 1295523 (2024) https://doi.org/10.1117/12.3009287
KEYWORDS: Image segmentation, Education and training, Deep learning, Performance modeling, Visual process modeling, Contour modeling, Semiconductors, Object detection, Transformers, Image processing

SPIE Journal Paper | 8 February 2024
Isaac Wilfried Sanou, Julien Baderot, Stéphanie Bricq, Yannick Benezeth, Franck Marzani, Sergio Martinez, Johann Foucher
JEI, Vol. 33, Issue 03, 031204, (February 2024) https://doi.org/10.1117/12.10.1117/1.JEI.33.3.031204
KEYWORDS: Electron microscopy, Deep learning, Education and training, Metrology, Image segmentation, Contour modeling, Laser sintering, Manufacturing, Performance modeling, Data modeling

Proceedings Article | 28 July 2023 Paper
Isaac Wilfried Sanou, Julien Baderot, Yannick Benezeth, Stéphanie Bricq, Franck Marzani, Sergio Martinez, Johann Foucher
Proceedings Volume 12749, 127490D (2023) https://doi.org/10.1117/12.2690493
KEYWORDS: Electron microscopy, Deep learning, Image segmentation, Education and training, Metrology, Scanning electron microscopy, Laser sintering, Transmission electron microscopy, Object detection, Contour modeling, Scanning transmission electron microscopy

Showing 5 of 52 publications
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