Dr. Philippe Hurat
Product Management Director at Cadence Design Systems Inc
SPIE Involvement:
Author
Publications (43)

Proceedings Article | 10 April 2024 Poster + Paper
Tsung-Wei Lin, Hung-Yu Lin, Meng-Shiun Chiang, Jung-Kuan Huang, Jason Sweis, Philippe Hurat, Chung-Chen Hsu, Chun-Sheng Wu, Chao-Yi Huang, Ya-Chieh Lai
Proceedings Volume 12954, 129541B (2024) https://doi.org/10.1117/12.3009892
KEYWORDS: Semiconducting wafers, Yield improvement, Tunable filters, Inspection, Image classification, Design, Scanning electron microscopy, Optical alignment, Wafer inspection, Defect inspection

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12954, 1295403 (2024) https://doi.org/10.1117/12.3010201
KEYWORDS: Transistors, Profiling, Design, Device simulation, Image classification, Matrices, Very large scale integration, Computer simulations, CMOS technology

Proceedings Article | 28 April 2023 Paper
Tsung-Wei Lin, Hung-Yu Lin, Mang-Shiun Chiang, Shi-Cheng Yeh, Jason Sweis, Philippe Hurat, Tung-Yu Wu, Chun-Sheng Wu, Chao-Yi Huang, Ya-Chieh Lai
Proceedings Volume 12495, 124951N (2023) https://doi.org/10.1117/12.2657649
KEYWORDS: Optical proximity correction, Design and modelling, Lithography, Manufacturing, Electronic design automation, Resolution enhancement technologies, Optics manufacturing, Image segmentation

Proceedings Article | 26 May 2022 Poster + Paper
Proceedings Volume 12053, 120531T (2022) https://doi.org/10.1117/12.2613620
KEYWORDS: Inspection, Semiconducting wafers, Wafer inspection, Image classification, Yield improvement, Defect inspection, Data analysis, Software development, Defect detection, Tolerancing

Proceedings Article | 26 May 2022 Poster + Paper
Tsung-Wei Lin, Chun Yen Liu, Hung-Yu Lin, Mang-Shiun Chiang, Jason Sweis, Philippe Hurat, Chun Yen Liao, Chun-Sheng Wu, Chao-Yi Huang, Ya-Chieh Lai
Proceedings Volume 12052, 120521E (2022) https://doi.org/10.1117/12.2612476
KEYWORDS: Optical proximity correction, Image classification, Databases, Transistors, Semiconductor manufacturing, Reliability, Profiling, Manufacturing, Library classification systems, Integrated circuits

Showing 5 of 43 publications
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