Prof. Michael Fiederle Profile

Prof. Michael Fiederle

at FMF - Freiburger Materialforschungszentrum

SPIE Involvement:

Conference Chair | Editor | Author

Publications (24)

Proceedings Article | 4 October 2024 Presentation

Energy calibration and performance evaluation of a 5mm thick CdTe sensor with a 55μm Timepix3 detector

Juan Sebastian Useche Parra, Gerardo Roque, Michael Kilian Schütz, Michael Fiederle, Simon Procz

Proceedings Volume PC13151, PC1315103 (2024) https://doi.org/10.1117/12.3027621

KEYWORDS: Sensors, Calibration, Source localization, Industry, Cameras, Time metrology, Spatial resolution, Safety, Kinematics, Industrial applications

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Proceedings Article | 4 October 2024 Presentation

Innovative two-stage acquisition method for spectroscopic CT-scans with a Timepix3 CdTe detector

Michael Kilian Schütz, Juan Sebastian Useche Parra, Gerardo Roque, Simon Procz, Jan Jakubek, Michael Fiederle

Proceedings Volume PC13151, PC131510B (2024) https://doi.org/10.1117/12.3027661

KEYWORDS: Spectroscopy, Sensors, Computed tomography, Spectroscopes, Imaging spectroscopy, Detector arrays, Data storage, Switching, Signal to noise ratio, Photon counting

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Proceedings Article | 4 October 2023 Presentation

All-inorganic Cs2AgBiBr6 double perovskite single crystals for radiation detectors

Michael Fiederle, Simay Sahsuvar, Harald Hillebrecht, Michael Daub, Catharine Schweinle

Proceedings Volume PC12696, PC1269603 (2023) https://doi.org/10.1117/12.2679710

KEYWORDS: Crystals, Perovskite, X-rays, Sensors, Optical properties

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Proceedings Article | 1 August 2021 Presentation

Energy weighted imaging of sub pixel contamination in pharmaceutical hard capsule with CdZnTe Timepix3

Julian Fey, Michael Schuetz, Simon Procz, Sebastian Useche, Michael Fiederle

Proceedings Volume 11838, 118380Y (2021) https://doi.org/10.1117/12.2596375

KEYWORDS: Contamination, Signal to noise ratio, Sensors, Tungsten, Spatial resolution, X-rays, Spectroscopy, Silicon, Semiconductors, Semiconductor materials

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Proceedings Article | 20 August 2020 Presentation

Energy calibration and performance of thick CdTe sensor with 55μm pixel pitch Timepix detector

Julian Fey, Simon Procz, Michael Schütz, Michael Fiederle

Proceedings Volume 11494, 114940G (2020) https://doi.org/10.1117/12.2570496

KEYWORDS: Sensors, Spectroscopy, Absorption, Spectroscopes, Gallium arsenide, Cameras, Spatial resolution

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Proceedings Article | 18 March 2015 Paper

Reducing the formation of image artifacts during spectroscopic micro-CT acquisitions

Marcus Zuber, Thomas Koenig, Rubaiya Hussain, Elias Hamann, Rafael Ballabriga, Michael Campbell, Alex Fauler, Michael Fiederle, Tilo Baumbach

Proceedings Volume 9412, 94124X (2015) https://doi.org/10.1117/12.2077685

KEYWORDS: Sensors, Spectroscopy, Gadolinium, Computed tomography, Temperature metrology, Polymethylmethacrylate, X-rays, Imaging spectroscopy, Photon counting, Iodine

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Proceedings Article | 5 September 2014 Paper

Investigation of the current-voltage characteristics, the electric field distribution and the charge collection efficiency in x-ray sensors based on chromium compensated gallium arsenide

A. Tyazhev, V. Novikov, O. Tolbanov, A. Zarubin, M. Fiederle, E. Hamann

Proceedings Volume 9213, 92130G (2014) https://doi.org/10.1117/12.2061302

KEYWORDS: Sensors, Gallium arsenide, Electric field sensors, X-rays, Nickel, Semiconducting wafers, Resistors, Chromium, Electrons, Infrared radiation

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Proceedings Article | 19 March 2014 Paper

Pooling optimal combinations of energy thresholds in spectroscopic CT

Thomas Koenig, Marcus Zuber, Elias Hamann, Armin Runz, Michael Fiederle, Tilo Baumbach

Proceedings Volume 9033, 90331A (2014) https://doi.org/10.1117/12.2043400

KEYWORDS: Spectroscopy, Sensors, Feature selection, Iodine, Gadolinium, Imaging spectroscopy, Photon counting, Computed tomography, Polymethylmethacrylate, Calibration

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Proceedings Article | 19 March 2014 Paper

Characterization of a hybrid energy-resolving photon-counting detector

A. Zang, G. Pelzer, G. Anton, R. Ballabriga Sune, F. Bisello, M. Campbell, A. Fauler, M. Fiederle, X. Llopart Cudie, I. Ritter, F. Tennert, S. Wölfel, W. Wong, T. Michel

Proceedings Volume 9033, 90333M (2014) https://doi.org/10.1117/12.2043526

KEYWORDS: Sensors, Silicon, Aluminum, Photodetectors, X-rays, Electronics, X-ray imaging, Analog electronics, Medical imaging, Image sensors

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Proceedings Article | 26 September 2013 Paper

Growth and characterization of CdTeSe for room-temperature radiation detector applications

U. Roy, A. Bolotnikov, G. Camarda, Y. Cui, A. Hossain, G. Yang, R. James, A. Fauler, M. Fiederle, M. Sowinska, G. Hennard, P. Siffert

Proceedings Volume 8852, 885210 (2013) https://doi.org/10.1117/12.2027081

KEYWORDS: Sensors, Crystals, Electrons, Image transmission, Selenium, Crystallography, X-ray diffraction, Luminescence, Infrared microscopy, Microscopy

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Proceedings Article | 24 October 2012 Paper

Surface processing of CdZnTe crystals

V. Gnatyuk, O. Vlasenko, S. Levytskyi, E. Dieguez, J. Crocco, H. Bensalah, M. Fiederle, A. Fauler, T. Aoki

Proceedings Volume 8507, 85071S (2012) https://doi.org/10.1117/12.937953

KEYWORDS: Crystals, Laser crystals, Surface finishing, Etching, Semiconductors, Wet etching, Transmittance, Laser irradiation, Polishing, Laser energy

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Proceedings Article | 27 August 2010 Paper

Special features of conductivity of semi-intrinsic CdTe and CdZnTe single crystals used in x- and gamma-ray detectors

L. Kosyachenko, E. Diequez, T. Aoki, C. Lambropoulos, V. Gnatyuk, M. Fiederle, S. Melnychuk, O. Maslyanchuk, O. Sklyarchuk, E. Grushko

Proceedings Volume 7805, 78051I (2010) https://doi.org/10.1117/12.862726

KEYWORDS: Semiconductors, Crystals, Sensors, Ionization, Temperature metrology, P-type semiconductors, Neodymium, N-type semiconductors, Gamma radiation, Absorption

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Proceedings Article | 27 August 2010 Paper

Measurements with coplanar grid (Cd,Zn)Te detectors and development of the GMCA (Gamma-ray analysis digital filter Multi Channel Analyzer)

M. Dambacher, A. Zwerger, A. Fauler, C. Disch, U. Stöhlker, M. Fiederle

Proceedings Volume 7805, 78051W (2010) https://doi.org/10.1117/12.863529

KEYWORDS: Sensors, Analog electronics, Digital signal processing, Gamma radiation, Spectroscopy, Field programmable gate arrays, Digital filtering, Energy efficiency, Prototyping, Photons

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Proceedings Article | 21 September 2007 Paper

Characterization of thick layers of CdTe grown with MBE for the fabrication of radiation detectors

D. Greiffenberg, R. Sorgenfrei, K. H. Bachem, A Zwerger, M. Fiederle

Proceedings Volume 6706, 670604 (2007) https://doi.org/10.1117/12.737961

KEYWORDS: Sensors, Gallium arsenide, Cadmium, Tellurium, X-rays, Luminescence, X-ray diffraction, Gallium, Interfaces, X-ray detectors

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Proceedings Article | 31 August 2005 Paper

Performance studies of CdZnTe detector by using a pulse shape analysis

A. Bolotnikov, G. Camarda, G. Carini, M. Fiederle, L. Li, G. Wright, R. James

Proceedings Volume 5922, 59220K (2005) https://doi.org/10.1117/12.618355

KEYWORDS: Sensors, Signal detection, X-rays, Shape analysis, Signal attenuation, Clouds, Signal generators, Crystals, Detection and tracking algorithms, Photons

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Proceedings Article | 20 January 2004 Paper

Growth of high-resistivity CdTe and (Cd,Zn)Te crystals

Michael Fiederle, Alex Fauler, Vladimir Babentsov, J. Konrath, Jan Franc

Proceedings Volume 5198, (2004) https://doi.org/10.1117/12.506032

KEYWORDS: Crystals, Sensors, Tin, Germanium, Indium, Cadmium, Electrons, Doping, Sensor performance, Tellurium

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Proceedings Article | 10 January 2003 Paper

Resistivity dependence on Zn concentration in semi-insulating (Cd,Zn)Te

Michael Fiederle, Alex Fauler, Vladimir Babentsov, Jan Franc, Klaus Werner Benz

Proceedings Volume 4784, (2003) https://doi.org/10.1117/12.450829

KEYWORDS: Zinc, Crystals, Cadmium, Tellurium, Semiconducting wafers, Spectroscopy, Sensors, Luminescence, Excitons, Line scan image sensors

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Proceedings Article | 18 December 2001 Paper

Pure and deep-level doped semi-insulating CdTe

Pavel Hoschl, Roman Grill, Jan Franc, Eduard Belas, Lyudmyla Turjanska, Ivan Turkevych, Klaus-Werner Benz, Michael Fiederle

Proceedings Volume 4507, (2001) https://doi.org/10.1117/12.450769

KEYWORDS: Cadmium, Doping, Annealing, Crystals, Vanadium, Sensors, Temperature metrology, Ionization, In situ metrology, Diffusion

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Proceedings Article | 22 February 2001 Paper

Compensation in semi-intrinsic CdTe-based materials

Vladimir Babentsov, Victoria Corregidor, Jose Castano, Ernesto Dieguez, Michael Fiederle, Tobias Feltgen, Klaus-Werner Benz

Proceedings Volume 4355, (2001) https://doi.org/10.1117/12.417791

KEYWORDS: Chlorine, Doping, Cadmium, Crystals, Chemical species, Neodymium, Tellurium, Gallium, Annealing, V band

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Proceedings Article | 26 October 1999 Paper

Self-cleaning effect and compensation mechanisms in Cl-doped high-resistivity cadmium telluride

Vladimir Babentsov, Victoria Corregidor, Klaus-Werner Benz, Tobias Feltgen, Michael Fiederle, Ernesto Dieguez

Proceedings Volume 3794, (1999) https://doi.org/10.1117/12.366734

KEYWORDS: Chlorine, Cadmium, Crystals, Tellurium, Sodium, Annealing, Chemical species, Doping, Zinc, Semiconducting wafers

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Proceedings Article | 6 July 1999 Paper

Detached growth of CdTe:Zn:V (STS-95): preliminary results

Michael Fiederle, Tobias Feltgen, J. Joerger, Klaus-Werner Benz, Thierry Duffar, P. Dussere, Ernesto Dieguez, Jean-Claude Launay, Gerald Roosen

Proceedings Volume 3792, (1999) https://doi.org/10.1117/12.351272

KEYWORDS: Crystals, Dewetting, Zinc, Semiconductors, X-rays, Solids, Vanadium, Surface roughness, Sensors, X-ray imaging

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Proceedings Article | 7 July 1997 Paper

Vapor crystal growth of CdTe under terrestrial and microgravity conditions

Klaus-Werner Benz, M. Laasch, T. Kunz, Michael Fiederle, Wolfgang Joerger

Proceedings Volume 3123, (1997) https://doi.org/10.1117/12.277706

KEYWORDS: Crystals, Chlorine, Gallium, Interfaces, Vanadium, Control systems, Solids, Sensors, Information operations, Diffusion

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Proceedings Article | 1 September 1995 Paper

Nondestructive characterization of Ti-doped and V-doped CdTe by time-dependent charge measurement

Clemens Eiche, Ralf Schwarz, Wolfgang Joerger, Michael Fiederle, Dirk Ebling, Klaus-Werner Benz

Proceedings Volume 2554, (1995) https://doi.org/10.1117/12.218197

KEYWORDS: Crystals, Titanium, Nondestructive evaluation, Time metrology, Electrodes, Vanadium, Diffusion, Neodymium, Information operations, Temperature metrology

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Proceedings Article | 15 June 1995 Paper

Resistivity and deep-level investigations of detector-grade CdTe: a comparison of different growth techniques

Dirk Ebling, Clemens Eiche, Michael Fiederle, Wolfgang Joerger, M. Laasch, Manfred Salk, Ralf Schwarz, Klaus-Werner Benz

Proceedings Volume 2519, (1995) https://doi.org/10.1117/12.211895

KEYWORDS: Crystals, Information operations, Sensors, Chlorine, Vanadium, Titanium, Doping, Gallium arsenide, Spectroscopy, Temperature metrology

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Showing 5 of 24 publications

Proceedings Volume Editor (12)

SPIE Conference Volume | 22 October 2024

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXVI

SPIE Conference Volume | 25 October 2023

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXV

SPIE Conference Volume | 14 October 2022

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXIV

SPIE Conference Volume | 16 September 2021

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXIII

SPIE Conference Volume | 28 September 2020

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXII

Showing 5 of 12 publications

Conference Committee Involvement (23)

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXVII

3 August 2025 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXVI

19 August 2024 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXV

21 August 2023 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXIV

22 August 2022 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXIII

1 August 2021 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXII

25 August 2020 | Online Only, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI

12 August 2019 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX

20 August 2018 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX

7 August 2017 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII

29 August 2016 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII

10 August 2015 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI

18 August 2014 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV

26 August 2013 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV

13 August 2012 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII

22 August 2011 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII

2 August 2010 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI

3 August 2009 | San Diego, California, United States

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X

11 August 2008 | San Diego, California, United States

Hard X-Ray and Gamma-Ray Detector Physics IX

27 August 2007 | San Diego, California, United States

Hard X-Ray and Gamma-Ray Detector Physics VIII

14 August 2006 | San Diego, California, United States

Hard X-Ray and Gamma-Ray Detector Physics VII

1 August 2005 | San Diego, California, United States

Hard X-Ray and Gamma-Ray Detector Physics VI

2 August 2004 | Denver, Colorado, United States

Hard X-Ray and Gamma-Ray Detector Physics V

4 August 2003 | San Diego, California, United States

Showing 5 of 23 Conference Committees

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