Taehee Park
at Inha Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 December 2022 Presentation + Paper
Proceedings Volume 12292, 1229205 (2022) https://doi.org/10.1117/12.2641647
KEYWORDS: Thin films, Extreme ultraviolet lithography, Electron beam lithography, FT-IR spectroscopy, Photoresist materials, Chemical reactions, Floods, Atomic layer deposition, Chemical analysis, Thin film deposition

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