Jinho Park
at Dongbu HiTek Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 April 2008 Paper
Proceedings Volume 6923, 69233K (2008) https://doi.org/10.1117/12.772534
KEYWORDS: Critical dimension metrology, Photoresist processing, Head-mounted displays, Glasses, Cadmium, Lithography, Semiconducting wafers, Inspection, Resolution enhancement technologies, Lenses

Proceedings Article | 21 March 2008 Paper
Proceedings Volume 6921, 69212O (2008) https://doi.org/10.1117/12.772480
KEYWORDS: Diffraction, Ray tracing, Copper indium disulfide, Diodes, Finite-difference time-domain method, CMOS sensors, Optical fiber cables, Microlens array, Image processing, Cell phones

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top