Yi-An Lin
at National Kaohsiung Univ. of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11123, 111230W (2019) https://doi.org/10.1117/12.2530716
KEYWORDS: Inspection, Source mask optimization, CCD cameras, Reflectivity, Image sensors, Imaging arrays, 3D metrology, Fringe analysis, Modulation, Image filtering

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