We present a methodology to distinguish between absorptive and scattering losses in SiN optical waveguide resonators by measuring the thermo-optic redshift in resonant wavelength and deducing absorption losses using thermal properties determined through the differential 3ω method. This information offers researchers valuable insights for improving device performance and optimizing fabrication processes. We demonstrate results on the effect of a 650oC thermal anneal on R=120um whispering-gallery mode microring resonators fabricated using N-rich PECVD SiN with n=1.92 at 800nm, which reduced total losses from 1.4dB/cm to 0.64dB/cm at 780nm and yielded an intrinsic-Q of 1.1 million, due primarily to decreased absorption losses.
We report on the design and performance of single-frequency VCSELs that are electro-optically tunable in the 852nm wavelength range. Electro-optic tuning of the index of refraction is achieved by changing the reverse-bias electric field in a secondary p-i-n junction that contains coupled quantum wells. The electro-optic tuning is enhanced by putting the index-tuning region in a secondary cavity of a dual-cavity VCSEL. Electro-optic tuning can achieve 1nm of wavelength tuning without changing laser power and can operate at modulation frequencies up to 1GHz.
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