Dr. Sergey Usenko Profile

Dr. Sergey Usenko

at European XFEL GmbH

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 9 June 2023 Presentation

Short-pulse diagnostics at the attosecond frontier for EuXFEL and FLASH (Conference Presentation)

Markus Ilchen, Sadia Bari, Thomas Baumann, Christopher Behrens, Yilmaz Bican, Mahdi Bidhendi, Rebecca Boll, Markus Braune, Günter Brenner, Francesca Callegari, Alberto De Fanis, Markus Degenhardt, Kristina Dingel, Stefan Düsterer, Felix Egun, Arno Ehresmann, Benjamin Erk, Lars Funke, Andreas Galler, Gianluca Geloni, Gesa Götzke, Tais Gorkhover, Jan Grünert, Patrik Grychtol, Marc Guetg, Andreas Hans, Arne Held, Ruda Hindrikson, Moritz Hoesch, Till Jahnke, Fini Jastrow, Reinhard Kienberger, Joakim Laksman, Mats Larsson, Jia Liu, Jon Marangos, Lutz Marder, David Meier, Michael Meyer, Najmeh Mirian, Jacobo Montano, Terence Mullins, Valerija Music, Christian Ott, Thorsten Otto, Yevheniy Ovcharenko, Steffen Palutke, Christopher Passow, Thomas Pfeifer, Nils Rennhack, Daniel Rivas, Daniel Rolles, Artem Rudenko, Patrick Rupprecht, Sara Savio, Albert Schletter, Frank Scholz, Jörn Seltmann, Svitozar Serkez, Philipp Schmidt, Evgeny Schneidmiller, Bernhard Sick, Richard Thomas, Sergey Usenko, Jens Viefhaus, Peter Walter, Vincent Wanie, Niclas Wieland, Lasse Wülfing, Mikhail Yurkov, Vitali Zhaunerchyk, Kai Tiedtke, Wolfram Helml

Proceedings Volume PC12581, PC1258108 (2023) https://doi.org/10.1117/12.2669164

KEYWORDS: Diagnostics, X-rays, X-ray technology, Structural dynamics, Photonics, Nonlinear dynamics, Liquid crystal lasers

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Proceedings Article | 6 June 2023 Presentation

Extending the ablation imprints method of focal spot characterisation from X-ray to visible and near-infrared spectral range (Conference Presentation)

Šimon Jelínek, Tomáš Burian, Jan Dostál, Roman Dudžák, Věra Hájková, Libor Juha, Michal Krupka, Zuzana Kuglerová, Thomas Baumann, Simon Dold, Tommaso Mazza, Yevheniy Ovcharenko, Sergey Usenko, Michael Meyer, Jaromír Chalupský

Proceedings Volume 12578, 125780B (2023) https://doi.org/10.1117/12.2670501

KEYWORDS: Laser ablation, Visible radiation, X-rays, X-ray characterization, Quantum systems, Laser damage threshold, Ablation, Pulsed laser operation, Laser systems engineering, Laser radiation

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