Oskar Ogor
at Physikalisch-Technische Bundesanstalt
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 December 2020 Presentation + Paper
Julian Heymes, Matthew Soman, Thomas Buggey, Chiaki Crews, George Randall, Alexander Gottwald, Andrew Harris, Andrew Kelt, Udo Kroth, Ian Moody, Xiao Meng, Oskar Ogor, Andrew Holland
Proceedings Volume 11454, 114541G (2020) https://doi.org/10.1117/12.2559711
KEYWORDS: Ultraviolet radiation, Image processing, Quantum efficiency, Calibration, Image sensors, Sensors, X-ray optics, X-rays, Wafer-level optics, Reflectivity

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top