Ju-Sik Kim
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 April 2023 Presentation
Proceedings Volume PC12485, PC1248506 (2023) https://doi.org/10.1117/12.2672417
KEYWORDS: Thermography, Error analysis, Thermal energy technology, Safety, Imaging systems, Failure analysis, Electrical breakdown

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