Infrared thermography for automatic condition-based monitoring in high voltage electrical equipment (Conference Presentation)

Jun Su Lee; Ju-Sik Kim; Jun-Hee Park; Joo-Hyung Kim

doi:10.1117/12.2672417

18 April 2023 Infrared thermography for automatic condition-based monitoring in high voltage electrical equipment (Conference Presentation)

Jun Su Lee, Ju-Sik Kim, Jun-Hee Park, Joo-Hyung Kim

Author Affiliations +

Proceedings Volume PC12485, Nano-, Bio-, Info-Tech Sensors, and Wearable Systems 2023; PC1248506 (2023) https://doi.org/10.1117/12.2672417
Event: SPIE Smart Structures + Nondestructive Evaluation, 2023, Long Beach, California, United States

Abstract

Condition-based monitoring has emerged as one of the important monitoring tools in power plants to continuously supply high-quality power. This paper, we describe a monitoring mechanism for high-voltage electrical equipment using thermal imaging with the aim of detecting faults in the power system in advance and reducing losses.

Conference Presentation

Citation Download Citation

Jun Su Lee, Ju-Sik Kim, Jun-Hee Park, and Joo-Hyung Kim "Infrared thermography for automatic condition-based monitoring in high voltage electrical equipment (Conference Presentation)", Proc. SPIE PC12485, Nano-, Bio-, Info-Tech Sensors, and Wearable Systems 2023, PC1248506 (18 April 2023); https://doi.org/10.1117/12.2672417

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available