Dr. Joerg Wiesmann Profile

Dr. Joerg Wiesmann

Managing Director - Finance and Marketing at Incoatec GmbH

SPIE Involvement:

Author

Proceedings Article | 1 August 2021 Presentation

Coordinated development of tubes and optics: new possibilities for x-ray sources

Moritz Schlie, Jürgen Graf, Frank Hertlein, Paul Radcliffe, Jörg Wiesmann, Carsten Michaelsen

Proceedings Volume 11837, 118370Q (2021) https://doi.org/10.1117/12.2600153

KEYWORDS: X-ray sources, X-ray optics, Crystallography, X-rays, Synchrotrons, Sensors, Diamond, Collimation, Calibration

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Proceedings Article | 9 September 2009 Paper

New microfocus source for x-ray diffractometry in the home-lab

Bernd Hasse, Jörg Wiesmann, Carsten Michaelsen

Proceedings Volume 7448, 74480Q (2009) https://doi.org/10.1117/12.824855

KEYWORDS: X-rays, Sensors, X-ray sources, Silver, Molybdenum, X-ray diffraction, Scattering, Beam shaping, Laser scattering, Copper

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Proceedings Article | 9 September 2009 Paper

Multilayer optics for femtosecond-diffractometry

J. Wiesmann, F. Hertlein, C. Michaelsen

Proceedings Volume 7448, 74480M (2009) https://doi.org/10.1117/12.824860

KEYWORDS: X-ray optics, X-rays, Multilayers, Capillaries, X-ray sources, Optics manufacturing, Beam shaping, Free electron lasers, Reflectometry, Wafer-level optics

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Proceedings Article | 18 May 2007 Paper

State-of-the-art thin film x-ray optics for synchrotrons and FEL sources

Frank Hertlein, Jörg Wiesmann, Carsten Michaelsen, Michael Störmer, Andreas Seifert

Proceedings Volume 6586, 658608 (2007) https://doi.org/10.1117/12.722452

KEYWORDS: Multilayers, X-ray optics, Free electron lasers, Reflection, Coating, Optics manufacturing, Reflectivity, Synchrotrons, Mirrors, Carbon

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Proceedings Article | 30 August 2005 Paper

Radiation damage to amorphous-carbon optical coatings

L. Juha, M. Bittner, M. De Grazia, J. Feldhaus, J. Gaudin, S. Guizard, S. Jacobi, M. Kozlova, J. Krasa, J. Krzywinski, H. Merdji, C. Michaelsen, T. Mocek, R. Nietubyc, M. Jurek, J. Polan, A. Prag, B. Rus, R. Sobierajski, B. Steeg-Keitel, M. Stoermer, M. Stupka, V. Vorlicek, J. Wiesmann, J. Wild

Proceedings Volume 5917, 59170F (2005) https://doi.org/10.1117/12.617125

KEYWORDS: Raman spectroscopy, Optical coatings, Atomic force microscopy, Free electron lasers, Extreme ultraviolet, Zinc, Carbon, Optical components, Vacuum ultraviolet, Mirrors

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Proceedings Article | 13 January 2004 Paper

Optimized performance of graded multilayer optics for x-ray single-crystal diffraction

Carsten Michaelsen, Joerg Wiesmann, Christian Hoffmann, A. Oehr, A. Storm, L. Seijbel

Proceedings Volume 5193, (2004) https://doi.org/10.1117/12.530264

KEYWORDS: Mirrors, X-rays, X-ray optics, Multilayers, Proteins, Crystals, X-ray diffraction, Diffraction, Ray tracing, Crystallography

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Proceedings Article | 24 December 2002 Paper

Recent developments of multilayer mirror optics for laboratory x-ray instrumentation

Carsten Michaelsen, Jörg Wiesmann, C. Hoffmann, K. Wulf, Lutz Brugemann, A. Storm

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.469363

KEYWORDS: Multilayers, X-rays, Mirrors, Silicon, Reflectivity, X-ray optics, X-ray diffraction, Aluminum, Reflectometry, X-ray fluorescence spectroscopy

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Proceedings Article | 24 December 2002 Paper

Characterization of amorphous carbon films as total-reflection mirrors for XUV free-electron lasers

Sandra Jacobi, Barbara Steeg, Jorg Wiesmann, Michael Stormer, Josef Feldhaus, Rüdiger Bormann, Carsten Michaelsen

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.450460

KEYWORDS: Carbon, Mirrors, Free electron lasers, Reflectivity, X-rays, Atomic force microscopy, Extreme ultraviolet, Reflectometry, Sputter deposition, Chemical vapor deposition

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