Dr. Jennifer E. Decker Profile

Dr. Jennifer E. Decker

Sr. Analyst at National Research Council Canada

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 18 August 2005 Paper

On the influence of gauge block roughness characteristic and surface treatment on length calibration by optical interferometry

Jennifer Decker, Peter Franke, Gerhard Boensch

Proceedings Volume 5879, 587907 (2005) https://doi.org/10.1117/12.614402

KEYWORDS: Calibration, Reflection, Surface roughness, Optical interferometry, Optical calibration, Interferometers, Integrating spheres, Phase shifts, Interfaces, Refractive index

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Proceedings Article | 2 August 2004 Paper

Methods to recognize the sample position for most precise interferometric length measurements

Rene Schoedel, Jennifer Decker

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.555835

KEYWORDS: Interferometry, Temperature metrology, Edge detection, Interferometers, Cameras, Data corrections, Phase interferometry, Autocollimation, Pixel resolution, Laser stabilization

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Proceedings Article | 20 November 2003 Paper

Next-generation Kösters interferometer

Jennifer Decker, Rene Schodel, Gerhard Bonsch

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503565

KEYWORDS: Interferometers, Calibration, Diffraction, Prisms, Refractive index, Phase shifts, Phase measurement, Mirrors, Interferometry, Temperature metrology

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Proceedings Article | 22 October 2001 Paper

Two-part study toward lowest uncertainty calibration of ceramic gauge blocks: interferometry and mechanical comparison techniques

Jennifer Decker, Anthony Ulrich, Alain LaPointe, Miguel Viliesid, James Pekelsky

Proceedings Volume 4401, (2001) https://doi.org/10.1117/12.445628

KEYWORDS: Calibration, Ceramics, Temperature metrology, Interferometry, Optical calibration, Optical interferometry, Silica, Metrology, Manufacturing, Interferometers

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Proceedings Article | 30 September 1998 Paper

Uncertainty of gauge block calibration by mechanical comparison: a worked example for gauge blocks of dissimilar materials

Jennifer Decker, Anthony Ulrich, James Pekelsky

Proceedings Volume 3477, (1998) https://doi.org/10.1117/12.323113

KEYWORDS: Calibration, Standards development, Temperature metrology, Tungsten, Thermal effects, Interferometry, Transducers, Chromium, Mathematical modeling, Optical interferometry

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