Jack Baker
at Cardiff Univ
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume PC12904, PC1290408 (2024) https://doi.org/10.1117/12.3001658
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Manufacturing, Reliability, Photovoltaics, Industry, High volume manufacturing, Gallium arsenide, Fabrication, Chip manufacturing

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12439, PC1243907 (2023) https://doi.org/10.1117/12.2650495
KEYWORDS: Vertical cavity surface emitting lasers, Sensors, Quantum wells, Optical pumping, Ytterbium, Temperature metrology, Strontium, Spectroscopes, Second-harmonic generation, Mirrors

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12439, PC124390C (2023) https://doi.org/10.1117/12.2648742
KEYWORDS: Vertical cavity surface emitting lasers, Epitaxy, Semiconducting wafers, Wavelength tuning, Wafer-level optics, Temperature metrology, Structural design, Spectrographs, Oxidation, Integrating spheres

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12439, PC124390B (2023) https://doi.org/10.1117/12.2648442
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, High volume manufacturing, Manufacturing, Gallium arsenide, Germanium, Three dimensional sensing, Reliability, Crystals

Proceedings Article | 25 May 2022 Presentation
Jack Baker, Sara Gillgrass, Tomas Peach, Craig Allford, J. Iwan Davies, Andrew Johnson, Andrew Joel, Sung Wook Lim, Samuel Shutts, Peter Smowton
Proceedings Volume PC12141, PC1214108 (2022) https://doi.org/10.1117/12.2624492
KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Gallium arsenide, Germanium, Oxides, Oxidation, Manufacturing, Surface finishing, Statistical analysis, Polishing

Proceedings Article | 9 March 2022 Presentation
Proceedings Volume PC12020, PC1202007 (2022) https://doi.org/10.1117/12.2610179
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Measurement devices, Reflectometry, Oxides, Oxidation, Bridges

Proceedings Article | 5 March 2021 Presentation
David Hayes, Tomas Peach, Jack Baker, Sara-Jayne Gillgrass, Craig Allford, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Curtis Hentschel, Clive Meaton, Samuel Shutts, Aidan Daly, Tracy Sweet, Iwan Davies, Peter Smowton
Proceedings Volume 11704, 1170406 (2021) https://doi.org/10.1117/12.2578592
KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Manufacturing, Wafer testing, Thermal oxidation, Reflectivity, Photoresist materials, Oxides, Electro optics, Analytical research

Proceedings Article | 5 March 2021 Presentation
Jack Baker, David Hayes, Tomas Peach, Sara Gillgrass, Craig Allford, Curtis Hentschel, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Clive Meaton, Aidan Daly, Tracy Sweet, Iwan Davies, Samuel Shutts, Peter Smowton
Proceedings Volume 11704, 1170408 (2021) https://doi.org/10.1117/12.2578365
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Thermal oxidation, Manufacturing, Calibration

Showing 5 of 8 publications
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