Dr. Hyeon Bo Shim
Staff Engineer at Samsung Electronics
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 1295511 (2024) https://doi.org/10.1117/12.3010209
KEYWORDS: Scanning electron microscopy, 3D image processing, 3D metrology, Design rules, Critical dimension metrology, Monte Carlo methods, Metrology, Manufacturing

Proceedings Article | 5 October 2023 Poster
JinA Lee, Kiwook Han, HyeonBo Shim, JaeWon Hahn
Proceedings Volume PC12653, PC126530K (2023) https://doi.org/10.1117/12.2682786
KEYWORDS: Transmittance, FSS based metamaterials, Wet etching, Visible radiation, Transparency, Extremely high frequency, Emissivity, Design and modelling, Adhesives, Visibility

Proceedings Article | 4 March 2019 Presentation
Proceedings Volume 10870, 108700O (2019) https://doi.org/10.1117/12.2508247
KEYWORDS: Scintillators, X-rays, Analytical research, Energy efficiency, Particles, Monte Carlo methods, Diagnostics, X-ray imaging, Performance modeling, Spatial resolution

Proceedings Article | 25 September 2017 Presentation
Proceedings Volume 10393, 103930N (2017) https://doi.org/10.1117/12.2273566
KEYWORDS: Scintillators, X-rays, Energy efficiency, Visible radiation, Absorption, Image resolution, Image quality, Particles, Fabrication, Manufacturing

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