Dr. David Necas
at Masaryk Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 26 April 2016 Paper
Proceedings Volume 9890, 989014 (2016) https://doi.org/10.1117/12.2227580
KEYWORDS: Silica, Thin films, Thin film devices, Optical constants, Ellipsometry, Spectrophotometry, Ultraviolet radiation, Instrument modeling, Spectral models, Optical properties, Product engineering, Optical components, Refractive index, Absorption, Reflectivity, Data modeling, Infrared spectroscopy, Atomic force microscopy

Proceedings Article | 24 September 2015 Paper
Proceedings Volume 9628, 96280R (2015) https://doi.org/10.1117/12.2191052
KEYWORDS: Thin films, Intelligence systems, Reflectance spectroscopy, Spectroscopy, Reflectometry, Imaging spectroscopy, Reflectivity, Ellipsometry, CCD cameras, Spectroscopic ellipsometry

Proceedings Article | 24 September 2015 Paper
Proceedings Volume 9628, 96280F (2015) https://doi.org/10.1117/12.2190109
KEYWORDS: Data modeling, Refractive index, Silica, Infrared spectroscopy, Spectroscopy, Ellipsometry, Silicon, Optical coatings, Systems modeling, Instrument modeling

Proceedings Article | 24 September 2015 Paper
Proceedings Volume 9628, 96281U (2015) https://doi.org/10.1117/12.2190104
KEYWORDS: Absorption, Refractive index, Electronics, Dielectrics, Phonons, Ultraviolet radiation, Europium, Infrared spectroscopy, Spectroscopy, Electrons

Proceedings Article | 24 September 2015 Paper
Proceedings Volume 9628, 96280C (2015) https://doi.org/10.1117/12.2190091
KEYWORDS: Intelligence systems, Spectroscopy, Reflectance spectroscopy, Imaging spectroscopy, Gallium arsenide, Refractive index, Data processing, Thin films, Spectroscopic ellipsometry, Atomic force microscopy

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