Albert W. Linder
Section Manager Mission Assurance at RTX Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 September 2015 Paper
A. Linder, Eddie Glines
Proceedings Volume 9608, 96080Y (2015) https://doi.org/10.1117/12.2189358
KEYWORDS: Failure analysis, Reliability, Semiconductors, Probability theory, Infrared radiation, Semiconducting wafers, Integrated circuits, Sensors, Human-computer interaction, Readout integrated circuits

Proceedings Article | 24 October 2012 Paper
A. Linder, J. Furlong, N. Malone, D. Madajian, A. Kar-Roy
Proceedings Volume 8511, 85110Y (2012) https://doi.org/10.1117/12.964388
KEYWORDS: Failure analysis, Reliability, Metals, Accelerated life testing, Integrated circuits, Sensors, Packaging, Readout integrated circuits, Signal processing, Statistical analysis

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