Dr. Arjun Kar-Roy Profile

Dr. Arjun Kar-Roy

Technical Director at Tower Semiconductor USA Inc

SPIE Involvement:

Conference Program Committee | Author | Science Fair Judge

Proceedings Article | 7 June 2024 Presentation + Paper

65nm ROIC platform for next-generation infrared commercial and defense applications

David Howard, Arjun KarRoy, Michael Scott

Proceedings Volume 13046, 130461F (2024) https://doi.org/10.1117/12.3013899

KEYWORDS: Metals, Readout integrated circuits, Semiconducting wafers, Capacitors, Transistors, Industrial applications, Analog electronics, Design rules, Defense and security, Copper

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Proceedings Article | 26 May 2020 Paper

High density integrated isolated deep silicon vias in silicon for 3D-ROIC FPA architectures

Arjun Kar-Roy, Sangki Hong, Yasir Qamar, Robert Patti

Proceedings Volume 11407, 114070E (2020) https://doi.org/10.1117/12.2558890

KEYWORDS: Semiconducting wafers, Readout integrated circuits, Analog electronics, Oxides, Silicon, Wafer bonding, Copper

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Proceedings Article | 26 September 2013 Paper

Performance of buried channel n-type MOSFETs in 0.18-μm CMOS image sensor process

Konstantin Stefanov, Zhige Zhang, Chris Damerell, David Burt, Arjun Kar-Roy

Proceedings Volume 8859, 88590I (2013) https://doi.org/10.1117/12.2024192

KEYWORDS: Transistors, Field effect transistors, Charge-coupled devices, Interfaces, Image processing, CMOS sensors, Semiconductors, Copper indium disulfide, CCD image sensors, Manufacturing

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Proceedings Article | 31 May 2013 Paper

Recent developments using TowerJazz SiGe BiCMOS platform for mmWave and THz applications

Arjun Kar-Roy, David Howard, Edward Preisler, Marco Racanelli

Proceedings Volume 8715, 871505 (2013) https://doi.org/10.1117/12.1518475

KEYWORDS: Silicon, Receivers, Antennas, Dynamic signature verification, Semiconducting wafers, Imaging arrays, Reticles, Fourier transforms, Metals, Field effect transistors

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Proceedings Article | 24 October 2012 Paper

Lifetime evaluation of CMOS mixed signal devices

A. Linder, J. Furlong, N. Malone, D. Madajian, A. Kar-Roy

Proceedings Volume 8511, 85110Y (2012) https://doi.org/10.1117/12.964388

KEYWORDS: Failure analysis, Reliability, Metals, Accelerated life testing, Integrated circuits, Sensors, Packaging, Readout integrated circuits, Signal processing, Statistical analysis

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Proceedings Article | 31 May 2012 Paper

Commercially developed mixed-signal CMOS process features for application in advanced ROICs in 0.18µm technology node

Arjun Kar-Roy, Paul Hurwitz, Richard Mann, Yasir Qamar, Samir Chaudhry, Robert Zwingman, David Howard, Marco Racanelli

Proceedings Volume 8353, 83531P (2012) https://doi.org/10.1117/12.919566

KEYWORDS: Capacitors, Readout integrated circuits, Field effect transistors, Metals, Oxides, CMOS technology, Capacitance, Molybdenum, Analog electronics, Staring arrays

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Proceedings Article | 13 October 2011 Paper

270GHz SiGe BiCMOS manufacturing process platform for mmWave applications

Arjun Kar-Roy, Edward Preisler, George Talor, Zhixin Yan, Roger Booth, Jie Zheng, Samir Chaudhry, David Howard, Marco Racanelli

Proceedings Volume 8188, 81880F (2011) https://doi.org/10.1117/12.901659

KEYWORDS: Diodes, Molybdenum, Fourier transforms, Metals, Radar, Resistors, Capacitors, Manufacturing, Signal processing, Capacitance

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Proceedings Article | 3 November 2010 Paper

Mixed-signal 0.18um CMOS and SiGe BiCMOS foundry technologies for ROIC applications

Arjun Kar-Roy, David Howard, Marco Racanelli, Mike Scott, Paul Hurwitz, Robert Zwingman, Samir Chaudhry, Scott Jordan

Proceedings Volume 7834, 78340R (2010) https://doi.org/10.1117/12.865173

KEYWORDS: Readout integrated circuits, Signal processing, CMOS technology, Oxides, Resistors, Metals, Capacitors, Field effect transistors, Fourier transforms, Digital signal processing

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Proceedings Article | 20 October 2010 Paper

SiGe BiCMOS manufacturing platform for mmWave applications

Arjun Kar-Roy, David Howard, Edward Preisler, Marco Racanelli, Samir Chaudhry, Volker Blaschke

Proceedings Volume 7837, 783707 (2010) https://doi.org/10.1117/12.865210

KEYWORDS: Metals, Resistors, Statistical modeling, Radar, Silicon, CMOS technology, Transceivers, Computer aided design, Manufacturing, Performance modeling

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Proceedings Article | 4 May 2010 Paper

Scaling and application of commercial, feature-rich, modular mixed-signal technology platforms for large format ROICs

Arjun Kar-Roy, Marco Racanelli, David Howard, Glenn Miyagi, Mark Bowler, Scott Jordan, Tao Zhang, William Krieger

Proceedings Volume 7660, 76603V (2010) https://doi.org/10.1117/12.850836

KEYWORDS: Metals, Capacitors, Readout integrated circuits, CMOS technology, Resistors, Field effect transistors, Statistical modeling, Cryogenics, Oxides, Analog electronics

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Showing 5 of 10 publications

Conference Committee Involvement (8)

Infrared Technology and Applications LI

13 April 2025 | Orlando, Florida, United States

Infrared Technology and Applications L

21 April 2024 | National Harbor, Maryland, United States

Infrared Technology and Applications XLIX

30 April 2023 | Orlando, Florida, United States

Infrared Technology and Applications XLVIII

3 April 2022 | Orlando, Florida, United States

Infrared Technology and Applications XLVII

12 April 2021 | Online Only, Florida, United States

Showing 5 of 8 Conference Committees

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