Mr. Adrian E. Kiss Profile

Adrian E. Kiss

at INOE

SPIE Involvement:

Author

Publications (2)

SPIE Journal Paper | 28 August 2024

Influence of annealing temperature on microstructural and optical properties of Cu-based transparent heat reflectors

Iulian Pana, Anca Parau, Mihaela Dinu, Adrian Kiss, Lydia Constantin, Alina Dragomir (Vladescu), Catalin Vitelaru

JPE, Vol. 14, Issue 03, 034001, (August 2024) https://doi.org/10.1117/12.10.1117/1.JPE.14.034001

KEYWORDS: Multilayers, Optical properties, Silicon nitride, Copper, Reflectivity, Quartz, Heat treatments, Temperature metrology, Annealing, Silicon

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Proceedings Article | 5 March 2022 Presentation + Paper

Ultralow-power deep-ultraviolet photodetection using oxide-nitride heterojunctions integrated on silicon

Nasir Alfaraj, Kuang-Hui Li, Chun Hong Kang, Laurentiu Braic, Nicolae Catalin Zoita, Adrian Emil Kiss, Tien Khee Ng, Boon Ooi

Proceedings Volume 12002, 1200208 (2022) https://doi.org/10.1117/12.2608070

KEYWORDS: Ceramics, Photodetectors, Silicon, Deep ultraviolet, Thin films, Heterojunctions, Thin film growth, Optoelectronics, Semiconductors, Optoelectronic devices

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