Paper
4 September 2015 High efficiency carbon-based multilayers for LAMP at 250 eV
Mingwu Wen, Qiushi Huang, Rui She, Li Jiang, Zhong Zhang, Zhanshan Wang, Hua Feng, Daniele Spiga, Angelo Giglia
Author Affiliations +
Abstract
X-ray reflection near the Brewster’s angle by multilayer mirrors can be used to detect the polarization from X-ray sources. The photon emission spectra from some isolated neutron stars and AGN/blazars etc. show that their emission is peaked at low energies near 250eV, which is just below carbon K-absorption edge. The Lightweight Asymmetry and Magnetism Probe (LAMP) is proposed as a micro-satellite mission dedicated for astronomical X-ray polarimetry working at 250 eV and is currently under early phase study. Co/C multilayers are selected and designed at the energy near 250eV with a grazing incident angle of 45°. The carbon layer thickness ratio is optimized to get the highest integral reflectivity which means larger effective signals in the astrophysics observation. The multilayer coatings were manufactured by direct current magnetron sputtering on D263 glasses and electroformed nickels and characterized using Grazing incidence X-ray reflectometry at 8keV. Reactive sputtering with 4%, 6% and 8% nitrogen were used to improve the Co/C multilayer interfaces respectively. Reflectivity for s-polarization and p-polarization light was measured at BEAR beamline in Elettra synchtron facility. Co/C multilayer deposited with 6% nitrogen exhibits the best performance comparing to other multilayers with different nitrogen content.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mingwu Wen, Qiushi Huang, Rui She, Li Jiang, Zhong Zhang, Zhanshan Wang, Hua Feng, Daniele Spiga, and Angelo Giglia "High efficiency carbon-based multilayers for LAMP at 250 eV", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96031A (4 September 2015); https://doi.org/10.1117/12.2186275
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Cited by 2 scholarly publications.
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KEYWORDS
Multilayers

Nitrogen

Reflectivity

Sputter deposition

Glasses

Lamps

X-rays

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