Fitting X-ray multilayer reflectivities by means of the PPM code

Daniele Spiga; Alessandro Mirone; Claudio Ferrero; Vincenzo Cotroneo; Giovanni Pareschi; Manuel Sanchez del Rio; Dervis Vernani

doi:10.1117/12.583232

21 October 2004 Fitting X-ray multilayer reflectivities by means of the PPM code

Daniele Spiga, Alessandro Mirone, Claudio Ferrero, Vincenzo Cotroneo, Giovanni Pareschi, Manuel Sanchez del Rio, Dervis Vernani

Author Affiliations +

Proceedings Volume 5536, Advances in Computational Methods for X-Ray and Neutron Optics; (2004) https://doi.org/10.1117/12.583232
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

A number of future hard X-ray (10-100 keV) telescopes will implement focusing optics with multilayer coatings. In this framework, we are developing (at INAF/Brera-Merate Astronomical Observatory) multilayer optics based on the e-beam deposition technique: this approach is suitable to coat very large surfaces at an high deposition rate; in order to test the performances of the deposited samples, X-ray reflectivity scans at the two "standard" photon energies of 8.05 and 17.4 keV are taken, returning very positive results with high peak reflectivities. However, the exact interpretation of the reflectivity curves is a complex task since it depends on a large number of parameters: the software PPM (Pythonic Program for Multilayers) has been recently developed by A. Mirone (ESRF) specifically to the aim of a friendly and fast determination of the parameters of multilayer structures. In particular, for this paper we present the layer-by-layer modelization of the characteristics (roughness, density, thickness) of multilayer stacks (Ni/C, Pt/C) by a multi-parametric "global" automatic optimization to reach the best fitting performances. In order to physically constrain the parameters, the data will be compared with the results of TEM measurements performed on the same samples, when available.

Citation Download Citation

Daniele Spiga, Alessandro Mirone, Claudio Ferrero, Vincenzo Cotroneo, Giovanni Pareschi, Manuel Sanchez del Rio, and Dervis Vernani "Fitting X-ray multilayer reflectivities by means of the PPM code", Proc. SPIE 5536, Advances in Computational Methods for X-Ray and Neutron Optics, (21 October 2004); https://doi.org/10.1117/12.583232

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