Progress in replication of substrates for multilayer coatings

Suzanne E. Romaine; John E. Everett; Ricardo J. Bruni; Adrian Ivan; Paul Gorenstein; Mauro Ghigo; Francesco Mazzoleni; Oberto Citterio; Joseph Pedulla

doi:10.1117/12.331277

19 November 1998 Progress in replication of substrates for multilayer coatings

Suzanne E. Romaine, John E. Everett, Ricardo J. Bruni, Adrian Ivan, Paul Gorenstein, Mauro Ghigo, Francesco Mazzoleni, Oberto Citterio, Joseph Pedulla

Author Affiliations +

Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331277
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Studies are being carried out to compare the performance of several different separation materials used in the replication process. This report presents the results obtained during the second year of a program which consists of replicating smooth, thin substrates, depositing multilayer coatings upon them, and evaluating their performance. Replication smooth, thin substrates, depositing multilayer coatings upon them, and evaluating their performance. Replication and multilayer coatings are both critically important to the development of focussing hard x- ray telescopes that function up to 100 keV. The activities of the current year include extending the comparison between sputtered amorphous carbon and evaporated gold to include sputtered as well as evaporated gold. The figure of merit being the smoothness of the replica which has a direct effect on the specular reflectivity. These results were obtained with epoxy replication, but they should be applicable to electroformed nickel, the process we expect to use for the ultimate replicated optics.

Citation Download Citation

Suzanne E. Romaine, John E. Everett, Ricardo J. Bruni, Adrian Ivan, Paul Gorenstein, Mauro Ghigo, Francesco Mazzoleni, Oberto Citterio, and Joseph Pedulla "Progress in replication of substrates for multilayer coatings", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331277

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Gold

Carbon

Multilayers

Data modeling

Reflectivity

Atomic force microscopy

Interfaces

Show All Keywords

Keywords/Phrases

Search In:

Publication Years