Mr. Renwei Zhang Profile

Renwei Zhang

at Dalian Univ of Technology

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Proceedings Article | 5 March 2018 Paper

Local high precision 3D measurement based on line laser measuring instrument

Renwei Zhang, Wei Liu, Yongkang Lu, Yang Zhang, Jianwei Ma, Zhenyuan Jia

Proceedings Volume 10710, 107101L (2018) https://doi.org/10.1117/12.2317530

KEYWORDS: Laser scanners

Read Abstract +

In order to realize the precision machining and assembly of the parts, the geometrical dimensions of the surface of the local assembly surfaces need to be strictly guaranteed. In this paper, a local high-precision three-dimensional measurement method based on line laser measuring instrument is proposed to achieve a high degree of accuracy of the three-dimensional reconstruction of the surface. Aiming at the problem of two-dimensional line laser measuring instrument which lacks one-dimensional high-precision information, a local three-dimensional profile measuring system based on an accurate single-axis controller is proposed. First of all, a three-dimensional data compensation method based on spatial multi-angle line laser measuring instrument is proposed to achieve the high-precision measurement of the default axis. Through the pretreatment of the 3D point cloud information, the measurement points can be restored accurately. Finally, the target spherical surface is needed to make local three-dimensional scanning measurements for accuracy verification. The experimental results show that this scheme can get the local three-dimensional information of the target quickly and accurately, and achieves the purpose of gaining the information and compensating the error for laser scanner information, and improves the local measurement accuracy.

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