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Wenwen Xu
at Southwest Jiaotong Univ
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Publications (1)
Proceedings Article | 15 November 2018 Paper
Investigation on wall thickness ranges using digital radiography for tangential projection technique
Wenwen Xu, Uwe Zscherpel, Jianping Peng, Lin Luo, Xiaorong Gao, Jinlong Li
Proceedings Volume 10964, 109645B (2018) https://doi.org/10.1117/12.2506324
KEYWORDS: Radiography, X-rays, Chromium, Sensors, Signal to noise ratio, Nondestructive evaluation, Inspection, Image filtering, X-ray imaging, Image quality
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