We have developed a scattering-type microscope operating in the mid-IR range with a polarization analysis. The
experimental development and the operation of the microscope are described. The optical system can provide for each
pixel of the image a matrix similar to a Jones matrix. Examples of polarization resolved images obtained on a SiO2/Si
surface grating with a tungsten probe are shown and a high optical resolution is clearly demonstrated through the
imaging of submicron metallic lines.
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