Ms. Dan Zhao Profile

Dan Zhao

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 15 October 2012 Paper

Plasma spectrum peak extraction algorithm of laser film damage

Dan Zhao, Jun-hong Su, Jun-qi Xu

Proceedings Volume 8417, 84171R (2012) https://doi.org/10.1117/12.973677

KEYWORDS: Plasma, Spectroscopy, Atmospheric plasma, Laser induced damage, Linear filtering, Detection and tracking algorithms, Digital filtering, Smoothing, Image filtering, Thin films

Read Abstract +

The plasma spectrometry is an emerging method to distinguish the thin-film laser damage. Laser irradiation film surface occurrence of flash, using the spectrometer receives the flash spectrum, extracting the spectral peak, and by means of the spectra of the thin-film materials and the atmosphere has determine the difference, as a standard to determine the film damage. Plasma spectrometry can eliminate the miscarriage of justice which caused by atmospheric flashes, and distinguish high accuracy. Plasma spectra extraction algorithm is the key technology of Plasma spectrometry. Firstly, data de noising and smoothing filter is introduced in this paper, and then during the peak is detecting, the data packet is proposed, and this method can increase the stability and accuracy of the spectral peak recognition. Such algorithm makes simultaneous measurement of Plasma spectrometry to detect thin film laser damage, and greatly improves work efficiency.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years