Zhang Yifei
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 March 2015 Paper
Pengcheng Hu, Yifei Zhang, Ting Wu, Guibin Yuan
Proceedings Volume 9446, 94462G (2015) https://doi.org/10.1117/12.2181146
KEYWORDS: Measurement devices, Laser systems engineering, Error analysis, Signal processing, Particle filters, Interferometry, Spatial resolution, Optical testing, Sensors, Interferometers

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