Dr. Yuebo Liu Profile

Dr. Yuebo Liu

at China Electronic Product Reliability and Environme

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Publications (9)

Proceedings Article | 30 April 2024 Paper

High conductivity multi-channel AlGaN/AlN/GaN heterostructure for underwater blue light detection

Yuebo Liu, QiuLing Qiu, Zesheng Lv, Honghui Liu

Proceedings Volume 13153, 1315306 (2024) https://doi.org/10.1117/12.3013635

KEYWORDS: Heterojunctions, Aluminum gallium nitride, Gallium nitride, Interfaces, Aluminum, Polarization, Barrier layers, Applied physics, Diodes, Semiconductors

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Proceedings Article | 18 March 2024 Paper

Determination of blind elements of InGaAs short-wave infrared focal plane detector with high effective pixel rate for low-orbit satellite communication based on dark signal voltage change rate and sliding window detection

Yuebo Liu, Meng Wang, Xi Luo, HongYue Wang, CanXiong Lai, ShaoHua Yang, GuoGuang Lu, Teng Ma

Proceedings Volume 13104, 131041M (2024) https://doi.org/10.1117/12.3022586

KEYWORDS: Infrared detectors, Short wave infrared radiation, Indium gallium arsenide, Reliability, Satellite communications

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Proceedings Article | 21 December 2023 Paper

Degradation mechanism of 1310nm vertical cavity surface emission laser

WenYuan Liao, JiDe Zhang, YueBo Liu, ShuWang Li, ShaoHua Yang, CanXiong Lai, GuoGuang Lu

Proceedings Volume 12966, 129660X (2023) https://doi.org/10.1117/12.3006295

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Industrial applications, Dark current, Semiconductor lasers, Semiconducting wafers, Vibration, Silicon photonics

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Proceedings Article | 21 December 2023 Paper

Effect of trapped charges and ionic charges distribution on n+-on-p HgCdTe photodiode properties

YueBo Liu, QiuLing Qiu, WenYuan Liao, Hao Niu, JiaHui Yan, ZongBei Dai, Teng Ma, ShaoHua Yang, CanXiong Lai

Proceedings Volume 12966, 129660W (2023) https://doi.org/10.1117/12.3006193

KEYWORDS: Mercury cadmium telluride, Infrared detectors, Photodiodes, Electrons, Contamination, Photocurrent, Doping, Electrodes

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The HgCdTe Photodiode is the most basic and important unit of HgCdTe IRFPA (Infra-red focal plane array) detectors, which have been widely used in the fields of security, fire protection, remote sensing and deep space detection. For HgCdTe IRFPA, the trapped charges of the HgCdTe material and the ionic charges introduced during the preparation process are the factors, other than environmental stress, that have the greatest impact on IRFPA performance. The trapped charges come from the trap energy level in the HgCdTe material, which exist during the crystal growth process and can be improved by adjusting the growth conditions, but it cannot be completely avoided. The ionic charges introduced during the process are generally concentrated at the interface and surface of the HgCdTe material, which can be reduced by process improvement, but cannot be completely avoided. In order to analyze the mechanism of multiple charges affecting the HgCdTe detector performance, a type of n+ -on-p HgCdTe Photodiode is selected as the object of this work, and the effects of the concentration and distribution of charges on the carrier distribution and energy band structure of the n+ -on-p HgCdTe are analyzed in detail. The introduction of additional net charge relative to an ideal n+ -on-p HgCdTe Photodiode leads to the aggregation or scavenging of local carriers and affects the energy band structure near the charge, creating additional potential barriers or potential wells, which is likely to cause device degradation. On this basis, the optoelectronic properties of the HgCdTe Photodiode have been investigated under infrared radiation at a wavelength of 9.5 μm, as the light I–V characteristics, the dynamic resistance–voltage characteristics, band structure and carrier density distribution. According to the results of this work, the quasi-fixed charges introduced by defects or contamination will directly affect the generation rate of photogenerated carriers and affect the I–V and R–V characteristics of the HgCdTe Photodiode, leading to phenomena such as rising dark currents, decreasing spectral response, and decreasing quantum efficiency.

Proceedings Article | 21 December 2023 Paper

Two-dimensional Si photonic crystal waveguide branch for 850 nm and 950 nm wavelengths

YueBo Liu, YiXiong Huang, WenYuan Liao, Hao Niu, JiaHui Yan, ShaoHua Yang, Teng Ma, HongYue Wang, CanXiong Lai

Proceedings Volume 12966, 129660R (2023) https://doi.org/10.1117/12.3005928

KEYWORDS: Waveguides, Silicon, Photonic crystals, Design and modelling, Silicon photonics, Optical communications, Incident light, Telecommunications, Integrated optics, Beam splitters

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Proceedings Article | 18 December 2023 Paper

Research on failure mechanism of high-power tapered semiconductor laser

WenYuan Liao, XingMian Chen, YueBo Liu, ShuWang Li, ShaoHua Yang, CanXiong Lai, GuoGuang Lu

Proceedings Volume 12959, 129590B (2023) https://doi.org/10.1117/12.3001233

KEYWORDS: Semiconductor lasers, Waveguides, High power lasers, Oxidation, Optical surfaces, Optical resonators, Electrodes, Aluminum, Thermal effects, Scanning electron microscopy

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Proceedings Article | 6 November 2023 Paper

Research on the contamination failure mechanism of HgCdTe IRFPA detectors

YueBo Liu, JiaHui Yan, WenYuan Liao, Hao Niu, XiYu Chen, HongYue Wang, CanXiong Lai, ShaoHua Yang

Proceedings Volume 12921, 129215D (2023) https://doi.org/10.1117/12.2692084

KEYWORDS: Ions, Mercury cadmium telluride, Interfaces, Contamination, Lithium, Liquid phase epitaxy, Doping, Sodium, Quantum processes, Passivation

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Proceedings Article | 23 January 2023 Paper

Research on the electrostatic discharge damage of CCD detectors

CanXiong Lai, ShaoHua Yang, ShuWang Li, YueBo Liu, WenYuan Liao, Yun Huang, GuoGuang Lu, QingZhong Xiao

Proceedings Volume 12556, 125561C (2023) https://doi.org/10.1117/12.2652049

KEYWORDS: Clocks, Charge-coupled devices, CCD image sensors, Sensors, Capacitors, Dielectrics, Capacitance, Silicon, Reliability, Manufacturing

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Proceedings Article | 23 January 2023 Paper

Low temperature thermal strain of the IRFPA and the creep lifetime evaluation of solder joints

YueBo Liu, JiaHui Yan, WenYuan Liao, Hao Niu, XiYu Chen, ShuWang Li, CanXiong Lai, ShaoHua Yang

Proceedings Volume 12556, 1255616 (2023) https://doi.org/10.1117/12.2651868

KEYWORDS: Sensors, Indium, Reliability, Infrared imaging, Infrared detectors

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Showing 5 of 9 publications

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