Dr. Yong Chan Jung
at Univ of Texas at Dallas
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 September 2021 Poster + Presentation
Proceedings Volume 11854, 118541C (2021) https://doi.org/10.1117/12.2601033
KEYWORDS: Extreme ultraviolet, Metals, Atomic layer deposition, Polymethylmethacrylate, Photoresist processing, FT-IR spectroscopy, Extreme ultraviolet lithography, Silicon, Resistance, Printed circuit board testing

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