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Yawen Cai
at Institute of Spacecraft System Engineering
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Publications (1)
Proceedings Article | 5 November 2020 Paper
A novel quality inspection method for components with small diameter and deep aperture
Yawen Cai, Jie Liu, Jiuli Liu, Chi Zhang
Proceedings Volume 11570, 115700J (2020) https://doi.org/10.1117/12.2579823
KEYWORDS: Inspection, Target detection, Detection and tracking algorithms, Feature extraction, Defect detection, Defect inspection
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