Prof. Xiu Li Profile

Prof. Xiu Li

at Tsinghua Univ Shenzhen International Graduate School

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 27 November 2023 Paper

Research on visual SLAM system based on near-infrared perception

Mengfang Liu, Boliang Li, Xiang Qian, Rui Ma, Peiyuang Zhu, Chengwei Liao, Haoyang Tian, Xiu Li, Xiaohao Wang, Xinghui Li

Proceedings Volume 12767, 1276708 (2023) https://doi.org/10.1117/12.2689364

KEYWORDS: Visualization, Visible radiation, Cameras, Pose estimation, Light sources and illumination, Motion measurement, Information visualization, Light sources, Motion estimation, Servomechanisms

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Proceedings Article | 4 January 2023 Presentation + Paper

A multi-source transfer learning-based weighted network for small sample defect inspection

Yue Hong, Chen Li, Haoxin Yan, Erik Valle , Yi Dou, Chengwei Liao, Peiyuan Zhu, Shidong Zhu, Xiu Li, Xiang Qian, Xiaohao Wang, Xinghui Li

Proceedings Volume 12317, 123170F (2023) https://doi.org/10.1117/12.2644054

KEYWORDS: Defect inspection, Artificial intelligence, Optical inspection, Network architectures, Machine learning, Lithium, Inspection, Detection and tracking algorithms, Statistical modeling, Solar cells

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Proceedings Article | 4 January 2023 Poster + Paper

Relational-based transfer learning for automatic optical inspection based on domain discrepancy

Erik Valle Salgado, Haoxin Yan, Yue Hong, Peiyuan Zhu, Shidong Zhu, Chengwei Liao, Yanxiang Wen, Xiu Li, Xiang Qian, Xiaohao Wang, Xinghui Li

Proceedings Volume 12317, 1231715 (2023) https://doi.org/10.1117/12.2644087

KEYWORDS: Optical inspection, Defect detection, Manufacturing, Machine vision, Machine learning, Convolutional neural networks

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Proceedings Article | 4 January 2023 Poster + Paper

A feature-based transfer-YOLOv5 model for rapid defect inspection in large mass magnetic tile manufacturing

Chen Li, Haoxin Yan, Shidong Zhu, Yue Hong, Peiyuan Zhu, Yanxiang Wen, Haoyang Tian, Chengwei Liao, Xiu Li, Xiaohao Wang, Xiang Qian, Xinghui Li

Proceedings Volume 12317, 1231716 (2023) https://doi.org/10.1117/12.2644099

KEYWORDS: Data modeling, Performance modeling, Manufacturing, Defect inspection, Image processing, Detection and tracking algorithms, Machine vision

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SPIE Journal Paper | 25 March 2021 Open Access

Neural network model assisted Fourier ptychography with Zernike aberration recovery and total variation constraint

Yongbing Zhang, Yangzhe Liu, Shaowei Jiang, Krishna Dixit, Pengming Song, Xinfeng Zhang, Xiangyang Ji, Xiu Li

JBO, Vol. 26, Issue 03, 036502, (March 2021) https://doi.org/10.1117/12.10.1117/1.JBO.26.3.036502

KEYWORDS: Neural networks, Contrast transfer function, Optical aberrations, Statistical modeling, Image restoration, Image quality, Computer simulations, Image processing, Tissues, Light emitting diodes

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