Prof. Xavier Aymerich
Professor at Univ Autonoma de Barcelona
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 30 June 2005 Paper
R. Fernandez, R. Rodriguez, M. Nafria, X. Aymerich
Proceedings Volume 5837, (2005) https://doi.org/10.1117/12.608245
KEYWORDS: Oxides, Oscillators, Transistors, Field effect transistors, Device simulation, Measurement devices, Reliability, Instrument modeling, Systems modeling, Dielectric breakdown

Proceedings Article | 28 June 2005 Paper
M. Porti, M. Avidano, M. Nafria, X. Aymerich, J. Carreras, B. Garrido
Proceedings Volume 5838, (2005) https://doi.org/10.1117/12.608206
KEYWORDS: Oxides, Silicon, Molybdenum, Electrons, Nanocrystals, Transmission electron microscopy, Electrodes, Atomic force microscopy, Ions, Computer programming

Proceedings Article | 29 April 2003 Paper
Daniel Hill, Sascha Sadewasser, Xavier Aymerich
Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.498556
KEYWORDS: Titanium, Atomic force microscopy, Oxides, Etching, Molybdenum, Aluminum, Silica, Dielectrics, Oxidation, Titanium dioxide

Proceedings Article | 29 April 2003 Paper
Marc Porti, Montserrat Nafria, Xavier Aymerich
Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.498778
KEYWORDS: Oxides, Reliability, Molybdenum, Metals, Electrodes, Silicon, Atomic force microscope, Transistors, Electrons, Electroluminescence

Proceedings Article | 29 April 2003 Paper
Xavier Blasco, Montserrat Nafria, Xavier Aymerich
Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.498901
KEYWORDS: Atomic force microscopy, Oxides, Molybdenum, Silicon, Dielectrics, Capacitors, Silica, Semiconducting wafers, Microelectronics, Oxidation

Proceedings Volume Editor (1)

SPIE Conference Volume | 29 April 2003

Conference Committee Involvement (2)
Nanotechnology II
9 May 2005 | Sevilla, Spain
Nanotechnology
19 May 2003 | Maspalomas, Gran Canaria, Canary Islands, Spain
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