Vincent Rouffiange
Marketing & Sales Manager at Amplitude
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 February 2012 Paper
Beat Neuenschwander, Beat Jaeggi, Marc Schmid, Vincent Rouffiange, Paul-E. Martin
Proceedings Volume 8243, 824307 (2012) https://doi.org/10.1117/12.908583
KEYWORDS: Picosecond phenomena, Laser ablation, Copper, Metals, Silicon, Pulsed laser operation, Scanning electron microscopy, Data modeling, Laser processing, Electrons

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