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Ting Huang
at The Chinese Univ. of Hong Kong
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 13 March 2024 Presentation
Cavity-enhanced quantitative phase profilometry for high contrast profiling of graphene
Proceedings Volume PC12852, PC128520E (2024) https://doi.org/10.1117/12.3008495
KEYWORDS: Graphene, Profiling, Signal to noise ratio, Optical path differences, Film thickness, Silicon, Monolayers, Silicon films, Refractive index, Refraction
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