Thomas W. Tonnessen
President at InSync Inc
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 11 December 1998 Paper
Szczesny Krasnicki, Jozef Maj, Wilfried Schildkamp, Thomas Tonnessen
Proceedings Volume 3448, (1998) https://doi.org/10.1117/12.332524
KEYWORDS: Monochromators, Crystals, Silicon, Composites, X-rays, Californium, X-ray diffraction, Reflection, Collimation, Thermal engineering

Proceedings Article | 21 November 1996 Paper
Proceedings Volume 2855, (1996) https://doi.org/10.1117/12.259832
KEYWORDS: Mirrors, Silicon, X-rays, 3D modeling, Heat flux, Surface finishing, Polishing, Glasses, Optical components, Silicon carbide

Proceedings Article | 12 November 1993 Paper
Thomas Tonnessen, Steven Fisher, Frank Anthony, David Lunt, Ali Khounsary, Kevin Randall, Efim Gluskin, Wenbing Yun
Proceedings Volume 1997, (1993) https://doi.org/10.1117/12.163827
KEYWORDS: Mirrors, 3D modeling, Heat flux, Thermal engineering, Distortion, Silicon, Coating, Polishing, Surface finishing, Objectives

Proceedings Article | 25 February 1993 Paper
Thomas Tonnessen, John Arthur
Proceedings Volume 1739, (1993) https://doi.org/10.1117/12.140538
KEYWORDS: Crystals, Silicon, Optical fabrication, Monochromators, X-ray diffraction, Distortion, Heat flux, Thermal engineering, Mirrors, Synchrotron radiation

Proceedings Article | 20 January 1993 Paper
Thomas Tonnessen, Steven Fisher
Proceedings Volume 1740, (1993) https://doi.org/10.1117/12.138710
KEYWORDS: Distortion, Mirrors, Synchrotrons, 3D modeling, Optical components, Beam analyzers, Silicon, Crystals, Gaussian beams, Channel projecting optics

Proceedings Volume Editor (2)

Conference Committee Involvement (4)
Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II
5 August 2004 | Denver, Colorado, United States
Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications
7 August 2003 | San Diego, California, United States
Optical Materials and Structures Technologies
4 August 2003 | San Diego, California, United States
Materials, Manufacturing, and Measurement for Synchrotron-Radiation Mirrors
30 July 1997 | San Diego, CA, United States
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