Takuya Kuroda
at SCREEN Semiconductor Solutions Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 April 2008 Paper
Alberto Beccalli, Paolo Canestrari, Mark Goeke, Masashi Kanaoka, Helmut Kandraschow, Takuya Kuroda, Danilo De Simone, Paolo Piacentini, Miriam Padovani, Paolo Piazza, Alessandro Rossi
Proceedings Volume 6924, 69244X (2008) https://doi.org/10.1117/12.779150
KEYWORDS: Semiconducting wafers, Critical dimension metrology, Immersion lithography, Lithography, Scanners, Silicon, Photoresist materials, Coating, Prototyping, Liquids

Proceedings Article | 26 March 2008 Paper
Masahiko Harumoto, Takuya Kuroda, Minoru Sugiyama, Akihiro Hisai
Proceedings Volume 6923, 69233J (2008) https://doi.org/10.1117/12.772367
KEYWORDS: Photoresist processing, Semiconducting wafers, Scanning electron microscopy, Raman spectroscopy, Chemical elements, Image processing, Polarization, Information operations, Epitaxial lateral overgrowth, System identification

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