Dr. Sylvain I. Misat
Manager Photolithography Applications at Kulicke & Soffa Netherlands B.V.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 25 March 2003 Paper
Rudy Pellens, Angelique van Klaveren, Rutger Voets, Jean-Paul van den Heuvel, Sylvain Misat, Pamela Waterson, Laurie Peterson
Proceedings Volume 4945, (2003) https://doi.org/10.1117/12.471974
KEYWORDS: Microelectromechanical systems, Lithography, Semiconducting wafers, Manufacturing, Packaging, Calibration, Photoresist materials, Micromachining, Critical dimension metrology, Silicon

Proceedings Article | 15 January 2003 Paper
Sylvain Misat, Rudy Pellens, Rutger Voets, Angelique van Klaveren, Jean-Paul van den Heuvel, L. Peterson, Pamela Waterson, D. Racicot, D. Roza
Proceedings Volume 4979, (2003) https://doi.org/10.1117/12.478241
KEYWORDS: Semiconducting wafers, Lithography, Microelectromechanical systems, Packaging, Coating, Polymers, Critical dimension metrology, Resistance, Thin film coatings, Micromachining

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