Electron Multiplying Charge Coupled Devices, EMCCD are used as x-ray detectors. The NSLS-II Soft Inelastic x- ray Scattering (SIX) beam line uses two EMCCDs for x-ray detection. Electrons drift and diffuse from generation point toward pixel gates and are collected there. The diffused electrons form a charge cloud distributed over several neighboring pixels. This charge sharing enables coordinate measurements with accuracy better than the pixel pitch. The charge distribution shape has to be taken into account to achieve ultimate accuracy in coordinate measurements. In this paper, we present a method of the charge distribution shape analysis and demonstrate its applications. The number of electrons collected under a pixel is proportional to the shape function integral. These electron packets get transferred to the sense node of the output amplifier. The transfer process could introduce distortions to the original charge distribution. For example, during transfers, electrons in the packet could be exposed to traps if they are present in the sensor. The trapping and later the release processes distort the apparent shape of the charge distribution. Therefore, deviations of the charge distribution shape from the originally symmetrical form can indicate the presence of trap centers in the sensor and can be used for sensor diagnostics.
We performed fully- and partially-coherent synchrotron emission and propagation simulations with the "Synchrotron Radiation Workshop" computer code to analyze the performance of two soft X-ray beamlines under development at the National Synchrotron Light Source II: Soft X-ray Nanoprobe (SXN), and Angle-Resolved Photoemission Spectroscopy (ARPES) and Resonant Inelastic X-ray Scattering (RIXS) Imaging (ARI). The SXN beamline intends to provide high flux and high spatial resolution coherent soft X-ray imaging capabilities using both zone plate and lensless coherent imaging techniques. The ARI beamline aims to perform high flux ARPES and RIXS experiments with a focal spot size at the sample approaching 100 nm using highly-demagnifying mirrors in Kirkpatrick-Baez geometry. To accurately calculate the resolution and the degree of X-ray coherence provided by the two state-of-the-art beamlines, partial coherence effects are required to be taken into account in wave optics simulations for these two beamlines. In this talk, beamline performance parameters such as spot size, degree of coherence, flux, and energy resolution at the sample are presented. The effects of mirror surface slope errors on beamline performance were studied and some suggestions for further optimization are discussed.
Imaging magnetic materials and structures as a function of external parameters, including magnetic and electric fields, and temperature will provide detailed insight into their dynamics and behavior. Coherent soft x-ray scattering (CSX) beamline at NSLS-II provide researchers a world leading coherent high photon flux with full polarization control. Coherent diffraction imaging, such as resonant soft x-ray ptychography and holography, are under commissioning at CSX and welcome new users. Very recently, we monitored thermal motions of magnetic domain wall with high magnetic contrast and 10nm spatial resolution using holography imaging. Moreover, a new holography chamber has been developed and installed at CSX beamline and it provided holography imaging capability to study magnetic materials as a function of temperature under in-situ condition (current injection and in-vacuum magnetic field).
Here, we highlight current achievements and discusses the future potential of magnetic soft X-ray imaging with a spatial resolution of sub-10nm at CSX beamline, NSLS-II.
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