Stephen Kockentiedt
at Otto-von-Guericke-Universität
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 February 2013 Paper
Stephen Kockentiedt, Klaus Tönnies, Erhardt Gierke, Nico Dziurowitz, Carmen Thim, Sabine Plitzko
Proceedings Volume 8655, 86550N (2013) https://doi.org/10.1117/12.2008374
KEYWORDS: Scanning electron microscopy, Signal to noise ratio, Interference (communication), Image processing, Tin, Silicon, Signal processing, Nanoparticles, Image filtering, Statistical analysis

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