Dr. Stefania Residori
Research Director at HOASYS SAS
SPIE Involvement:
Conference Program Committee | Author
Publications (30)

Proceedings Article | 13 March 2024 Presentation + Paper
Justin Thomas, Stefania Residori, Umberto Bortolozzo, Philippe Gain, Gilles Thuret
Proceedings Volume 12900, 1290003 (2024) https://doi.org/10.1117/12.3006171
KEYWORDS: Cameras, Cornea, Digital micromirror devices, Ophthalmology, Eye, Micromirrors, Statistical analysis, Image segmentation, Digital Light Processing, Calibration

Proceedings Article | 9 March 2023 Presentation
Proceedings Volume PC12447, PC124472Z (2023) https://doi.org/10.1117/12.2655800
KEYWORDS: Gyroscopes, Doppler effect, Phase measurement, Sagnac interferometers, Phase interferometry, Metrology, Interferometry

Proceedings Article | 1 August 2021 Presentation
Proceedings Volume 11807, 118070O (2021) https://doi.org/10.1117/12.2595585

Proceedings Article | 1 March 2019 Paper
Proceedings Volume 10934, 109340Y (2019) https://doi.org/10.1117/12.2516606
KEYWORDS: Liquid crystals, Doppler effect, Refractive index, Polarization, Two wave mixing, Phase shifts, Ultrafast phenomena, Interferometers, Femtosecond phenomena, Signal to noise ratio

Proceedings Article | 20 February 2017 Paper
Proceedings Volume 10119, 101191B (2017) https://doi.org/10.1117/12.2261211
KEYWORDS: Liquid crystals, Femtosecond phenomena, Hyperspectral imaging, Spectral resolution, Temporal resolution, Ultrafast imaging, Interferometry, Crystals, Ultrafast phenomena, Molecules

Showing 5 of 30 publications
Conference Committee Involvement (12)
Optical Sensing and Precision Metrology
25 January 2025 | San Francisco, California, United States
Quantum Sensing, Imaging, and Precision Metrology III
25 January 2025 | San Francisco, California, United States
Quantum Sensing, Imaging, and Precision Metrology II
27 January 2024 | San Francisco, California, United States
Quantum Sensing, Imaging, and Precision Metrology
28 January 2023 | San Francisco, California, United States
Optical and Quantum Sensing and Precision Metrology II
22 January 2022 | San Francisco, California, United States
Showing 5 of 12 Conference Committees
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