Dr. Simon Ruffell
at Australian National Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 February 2010 Paper
Iain Crowe, Oksana Hulko, Andrew Knights, Nicholas Hylton, Matthew Halsall, Simon Ruffell, Russell Gwilliam
Proceedings Volume 7606, 76061K (2010) https://doi.org/10.1117/12.852924
KEYWORDS: Raman spectroscopy, Silicon, Annealing, Oxides, Nanocrystals, Transmission electron microscopy, Diffusion, Phonons, Silica, Temperature metrology

Proceedings Article | 17 February 2010 Paper
N. Hylton, I. Crowe, A. Knights, M. Halsall, S. Ruffell, R. Gwilliam
Proceedings Volume 7606, 760604 (2010) https://doi.org/10.1117/12.852922
KEYWORDS: Erbium, Luminescence, Annealing, Silica, Silicon, Ions, Sapphire, Temperature metrology, Spectroscopy, Absorption

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