Dr. Shivakumar Raman
at Univ of Oklahoma
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 November 2005 Paper
S. Raman, T. Trafalis, R. Gilbert
Proceedings Volume 5999, 59990A (2005) https://doi.org/10.1117/12.631522
KEYWORDS: Metrology, Manufacturing, Tolerancing, Inspection, Error analysis, Raman spectroscopy, Statistical analysis, Time metrology, Optimization (mathematics), Curium

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