We report on a new developed interference lithography system that allows flexible design of the slant angle and pattern pitch of the diffraction grating. The system consists of two optical paths moving on an arc stage and another stage moving horizontally with precision, allowing the slant angle and pattern pitch to be controlled up to ±25 degrees and from 150 to 500nm, typically. In addition, this system is equipped with a fine stage for semiconductor lithography, diode-pumped solid-state lasers with wavelengths of 266nm and 355nm, and a high-resolution actuator to achieve 0.01nm pitch accuracy and high contrast exposure. Slant gratings with different angles and directions depending on their position on a wafer can be processed with this system. This presentation will also introduce various structures developed with this system and examples of their potential applications.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.