Mr. Ronald F. Rykowski Profile

Ronald F. Rykowski

CTO at Zemax LLC

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 11 October 2012 Paper

Reverse radiance: a fast accurate method for determining luminance

Kenneth Moore, Ronald Rykowski, Sanjay Gangadhara

Proceedings Volume 8485, 84850I (2012) https://doi.org/10.1117/12.931491

KEYWORDS: Sensors, Ray tracing, Light emitting diodes, Axicons, Data modeling, Target detection, Zemax, Light sources, Near field, Spectroscopy

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Proceedings Article | 22 August 2009 Paper

Efficient measurement of large light source near-field color and luminance distributions for optical design and simulation

Hubert Kostal, Douglas Kreysar, Ronald Rykowski

Proceedings Volume 7429, 742908 (2009) https://doi.org/10.1117/12.826261

KEYWORDS: Light sources, Near field, Imaging systems, Optical design, Optical testing, Headlamps, Light, Control systems, Optical simulations, Light sources and illumination

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Proceedings Article | 19 January 2009 Paper

Methods for measuring display defects as correlated to human perception

H. Kostal, G. Pedeville, R. Rykowski

Proceedings Volume 7242, 72420G (2009) https://doi.org/10.1117/12.805450

KEYWORDS: Image processing, Imaging systems, LCDs, Defect detection, Image analysis, Image filtering, Image quality, Visualization, Image quality standards, Control systems

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Proceedings Article | 25 February 2008 Paper

Novel approach for LED luminous intensity measurement

Ron Rykowski, Hubert Kostal

Proceedings Volume 6910, 69100C (2008) https://doi.org/10.1117/12.760817

KEYWORDS: Light emitting diodes, Optical spheres, Calibration, LED displays, Goniophotometry, Cameras, Imaging systems, Light sources, Integrating spheres, Manufacturing

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