Roman Velgan
at Univ Erlangen-Nürnberg
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 May 2003 Paper
Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500529
KEYWORDS: Metals, Defect detection, Clouds, Projection systems, Inspection, Optical testing, Visualization, Manufacturing, Digital micromirror devices, CCD cameras

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