Rodney R. Hoffman
Senior Staff Engineer at L3Harris Technologies Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2005 Paper
Rodney Hoffman, Andy Singleton, Gary Walker
Proceedings Volume 5877, 58770F (2005) https://doi.org/10.1117/12.612102
KEYWORDS: Scanners, Signal to noise ratio, Remote sensing, Aluminum, Sensors, Failure analysis, Infrared sensors, Infrared radiation, Thermal modeling, Finite element methods

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