Dr. Richard P. Kingsborough Profile

Dr. Richard P. Kingsborough

Staff Member at MIT Lincoln Lab

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Author

Publications (9)

Proceedings Article | 14 June 2023 Presentation + Paper

Low-SWaP-C colorimetric detection of vapor-phase chemical threats

Richard Kingsborough, Alexandra Wrobel, Enya Mulroy, Jude Kelley, William Barney, Roderick Kunz

Proceedings Volume 12541, 125410N (2023) https://doi.org/10.1117/12.2663181

KEYWORDS: Sensors, Dyes, Chemical fiber sensors, Light emitting diodes, Biological and chemical sensing, Prototyping, Chemical weapons, Windows, Toxic industrial chemicals, Signal detection

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Proceedings Article | 24 April 2020 Presentation + Paper

Parametric optimization for enhanced sensitivity in a colorimetric chemical sensory

Richard Kingsborough, Alexandra Wrobel, Roderick Kunz

Proceedings Volume 11416, 114160K (2020) https://doi.org/10.1117/12.2558159

KEYWORDS: Cell phones, Sensors, Cameras, Spectroscopy, Chemical analysis, Absorption, Light emitting diodes, Receivers, Absorbance, Light

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Proceedings Article | 24 April 2020 Presentation + Paper

Chemical sensing via a low SWaP wearable spectrometer

Richard Kingsborough, Alexandra Wrobel, Devon Beck, Lauren Cantley, Shane Tysk, Roderick Kunz

Proceedings Volume 11416, 114160O (2020) https://doi.org/10.1117/12.2558158

KEYWORDS: Sensors, Spectroscopy, Light emitting diodes, Photodiodes, Biological and chemical sensing, Toxic industrial chemicals, Electronics, Data modeling, Absorbance

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Proceedings Article | 17 May 2019 Paper

Low SWaP chemical sensing via a fabric-based spectrometer

Richard Kingsborough, Alexander Stolyarov, Lauren Cantley, Shane Tysk, Maxwell Plaut, Robert Trudeau, Mordechai Rothschild, Richard Osgood

Proceedings Volume 11010, 110101C (2019) https://doi.org/10.1117/12.2522343

KEYWORDS: Spectroscopy, Reflectivity, Toxic industrial chemicals, Biological and chemical sensing, Absorption, Sensors, Chemical fiber sensors, Colorimetry, Thin films

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Proceedings Article | 31 May 2018 Paper

Fiber-based chemical sensing and sensing platforms with colorimetric dyes

Richard Kingsborough, Stephen Giardini, Do-Joong Lee, Jin Ho Kim, Keegan Quigley, Alexander Stolyarov, Lauren Cantley, Shane Tysk, Conor Hennessy, Mordechai Rothschild, Rachel Odessey, Jimmy Xu, Richard Osgood

Proceedings Volume 10629, 106291E (2018) https://doi.org/10.1117/12.2304766

KEYWORDS: Sensors, Copper, Ions, Biological and chemical sensing, Light emitting diodes, Toxic industrial chemicals, Colorimetry, Chemical analysis, Reflectivity, Absorption

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Proceedings Article | 26 October 2017 Paper

Solar metadevice with enhanced absorption, scattering, and spectral control

R. Osgood, Y. Ait-El-Aoud, S. Giardini, N. LeGrand, M. Okamoto, A. Luce, V. Liberman, L. Parameswaran, R. Kingsborough, M. Rothschild, S. Kooi

Proceedings Volume 10343, 103430Z (2017) https://doi.org/10.1117/12.2273748

KEYWORDS: Absorption, Amorphous silicon, Aluminum, Thin films, Scattering, Solar cells, Nanostructures, Glasses, Reflectivity, Polymethylmethacrylate

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Proceedings Article | 7 October 2014 Paper

Scattering of long wavelengths into thin silicon photovoltaic films by plasmonic silver nanoparticles

R. Osgood, K. Bullion, S. Giardini, J. Carlson, P. Stenhouse, R. Kingsborough, V. Liberman, L. Parameswaran, M. Rothschild, O. Miller, S. Kooi, J. Joannopoulos, F. Jeffrey, S. Braymen, H. Singh Gill, J. Kumar

Proceedings Volume 9178, 91780I (2014) https://doi.org/10.1117/12.2062268

KEYWORDS: Scattering, Nanoparticles, Antimony, Silver, Thin films, Light scattering, Particles, Laser scattering, Silicon films, Polymers

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Proceedings Article | 2 April 2010 Paper

Electron-beam directed materials assembly

Richard Kingsborough, Russell Goodman, David Astolfi, Theodore Fedynyshyn

Proceedings Volume 7637, 76370N (2010) https://doi.org/10.1117/12.846000

KEYWORDS: Electron beam lithography, Nanostructures, Picosecond phenomena, Silicon, Polymers, Scanning electron microscopy, Semiconducting wafers, Lithography, Photomicroscopy, Polymer thin films

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Proceedings Article | 18 March 2009 Paper

Lithographically directed materials assembly

Richard Kingsborough, Russell Goodman, Keith Krohn, Theodore Fedynyshyn

Proceedings Volume 7271, 72712D (2009) https://doi.org/10.1117/12.814625

KEYWORDS: Silicon, Polymethylmethacrylate, Polymers, Etching, Scanning electron microscopy, Lithography, Silicon films, Semiconducting wafers, Photomasks, Nitrogen

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Showing 5 of 9 publications

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